Control of Wavelength, Polarization, Time-Structure and Divergence for Synchrotron Radiation Topography
Chapter
Abstract
In the wavelength range near λ = lA Bragg reflection perfect crystals are the most useful optical components available. Modern commercially available single crystals of silicon and germanium are inexpensive, almost undamaged by radiation and, from the diffraction point, ideally perfect.
Keywords
Bragg Reflection Electron Bunch Reflection System Beam Conditioning Bragg Plane
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References
- 1.R.W. James (1948). The optical principles of the diffraction of X-rays, Bell, LondonGoogle Scholar
- 2.W.H. Zachariasen (1945) Theory of X-ray diffraction in crystals, Wiley, New York.Google Scholar
- 3.J.C. Slater (1958) Rev. Mod.Phys. 30, 197MathSciNetADSMATHCrossRefGoogle Scholar
- 4.G. Borrmann, (1959) Rontgenwellenfelder in Beitrage zur Physik und Chemie des 20Jahrhunderts, Vieweg und Sohn, BrunswickGoogle Scholar
- 5.M. von Laue (1960) Rontgenstrahl - Interferenzen, Akademische Verlag, FrankfurtGoogle Scholar
- 6.R.W. James (1963) Solid State Phys. 15, 55Google Scholar
- 7.B. W. Batterman and H. Cole (1964) Rev. Mod. Phys. 36, 681Google Scholar
- 8.L.V. Azaroff, K. Kaplow, N. Kato, R.J. Weiss, A.J.C. Wilson and R.A. Young (1974) X-ray diffraction,McgrawHill, New YorkGoogle Scholar
- 9.Z.G. Pinsker (1978) Dynamical scattering of X-rays in crystals. Springer, BerlinCrossRefGoogle Scholar
- 10.A.H. Compton and S.K. Allison (1935) X-rays in theory and experiment, Van Nostrand, New York.Google Scholar
- 11.L.V. Azaroff (1974) X-ray Spectroscopy, McGraw-Hill, New YorkGoogle Scholar
- 12.U. Bonse and M. Hart (1965) App. Phys. Lett. 7, 238Google Scholar
- 13.M. Hart and D.P. Siddons (1978) Nature, London 275, 45ADSCrossRefGoogle Scholar
- 14.M. Hart and D.P. Siddons (1978) Workshop on X-ray and neutron interferometry. Ed. U. Bonse and H. Rauch.(OUP)Google Scholar
- M. HARTGoogle Scholar
- 15.M. Hart and A.R.D. Rodrigues (1978) J. Appt Cryst. 11, 248CrossRefGoogle Scholar
- 16.M. Hart and A.R.D. Rodrigues (1979) Phil. Mag 40, 149CrossRefGoogle Scholar
- 17.M. Hart (1975) J. Appl. Cryst. 8, 436Google Scholar
- 18.U. Bonse, G. Materlik and W. Schroder (1976) J. Appl. Cryst. 9, 223.Google Scholar
- 19.S. Kikuta and K. Kohra (1970) J. Phys. Soc. Japan 29, 1322Google Scholar
- 20.M. Hart (1978) Phil. Mag 38, 41CrossRefGoogle Scholar
- 21.H. Cole, F.W. Chambers and C.G. Wood (1961) J. Appl. Phys. 32, 1942Google Scholar
- 22.J. Miltat (1979) Imaging Processes and coherence in physics, Les Houches, SpringerGoogle Scholar
- 23.K. Kohra, M. Ando and T. Matsushita (1978) Nucl. Instrum & Meth. 152, 161ADSCrossRefGoogle Scholar
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