Abstract
Finding the diffracted beam and adjusting the crystal are the standard preliminaries before taking a topograph. A convenient X-ray detector and associated circuitry are a great help, if not essential. We will commence by reviewing X-ray photon detectors, and will outline the type of detector and counting circuit combination that satisfies the topographer’s needs in the simplest way. In our discussion of photographic recording in Sectión 12.2 we will deal most fully with the Ilford L4 nuclear emulsion which has served X-ray topography well for over two decades, but we shall also consider recording means having resolving powers both lower and higher than this nuclear emulsion. In addition, we will offer practical advice on the photomicrography of topography. Next, in Section 12.3 we will discuss electronic recording methods which make ‘instant topography’ possible. In all attempts at quantitative discussion, we shall not hesitate to use approximations and rounding-off of numbers in order to simplify the presentation.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
H.P. Klug and L.E. Alexander (1979) X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd edition Wiley-Interscience, New York - London - Sydney - Toronto.
B.L. Cardozo and R.J. Ritsma (1968) IEEE Transactions in Audio and Electroacoustics AU-16 159
H.J. Zweig (1961) J. Opt. Soc. America 51, 310
R.C. Valentine (1966) in Advances in Optical and Electron Microscopy, Vol. 1 (ed. R. Barer and V. E. Cosslett) Academic Press, London New York.
A. Charlesby (1940) Proc.Phys. Soc. Lond. 52, 657
Y. Epelboin, A. Jeanne-Michaud and A. Zarka (1979) J. Appl. Cryst 12, 201
A.R. Lang (1978) in Diffraction and Imaging Techniques in Material Science, Volume II: Imaging and Diffraction Techniques; Second revised edition (ed. S. Amelinckx, R. Gevers and J. Van Landuyt) North-Holland Pub. Co. Amsterdam-New-York-Oxford, p 623
H. DeVries (1943) Physica 10, 553.
A. Rose (1942) Proc. Inst. Radio Engrs. 30, 295.
M. Elder and O.S. Mills (1979) A Survey of X-ray Films, Report to the Commision on Crystallographic Apparatus of the International Union of Crystallography.
E. Spiller and R. Feder (1977) in X-ray Optics (ed. H.J. Queisser) Springer -Verlag, Berlin -Heidelberg - New York, p. 35.
S. Mardix and A.R. Lang (1979) Rev. Sci. Instrum. 50, 510
A.R. Lang and K. Reifsnider (1969) Appl. Phys. Lett. 15, 258
A.L.N. Stevels and W. Kuhl (1974) Medicamundi 19, 3
J.I. Chikawa and I. Fujimoto (1968) Appl. Phys. Lett. 13, 387
R.E. Green, Jnr. (1971) in Advances in X-ray Analysis (ed.C.S. Barrett, J.B. Newkirk and C.O. Ruud) Plenum Press, New York, p. 311
W. Hartmann (1977) in X-ray Optics (ed. H.J. Queisser) Springer-Verlag, Berlin - Heidelberg - NewYork, p. 190
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1980 Springer Science+Business Media New York
About this chapter
Cite this chapter
Lang, A.R. (1980). X-ray Detectors. In: Tanner, B.K., Bowen, D.K. (eds) Characterization of Crystal Growth Defects by X-Ray Methods. Nato Advanced Study Institutes Series, vol 63. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1126-4_12
Download citation
DOI: https://doi.org/10.1007/978-1-4757-1126-4_12
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-1128-8
Online ISBN: 978-1-4757-1126-4
eBook Packages: Springer Book Archive