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X-Ray Topography and Related Techniques Using Synchrotron Radiation

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Defects in Solids

Part of the book series: NATO ASI Series ((NSSB))

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Abstract

X-Ray Topography (XRT) is a non destructive imaging technique based on the difference in reflecting power between perfect and imperfect crys tal regions. When coupled with proper detectors, it provides a two dimensional map of the defect content in a single crystal. However, X-rays are almost exclusively sensitive to the strain field associated with a particular imperfection and hence, only those defects producing strains larger than the minimum detectable limit (now 10−8) over areas broader than the spatial resolution (about lum) may ever be detected by this method. Moreover, these figures are utmost performances which cannot be achieved on standard set ups as will be developed in the following. When compared to Transmission Electron Microscopy (TEM)1, XRT is then able to reveal non destructively the same type of defects: dislocations, stac king faults, planar boundaries, precipitates or impurity induced strains with a much better sensitivity but a poorer spatial. resolution. XRT is thus restricted to study single crystals with a low density of imper fections. Contrary to TEM, it will be mostly suitable to investigate the initial stages of processes like microplasticity, phase transformations, since the field of view is broad enough (about a few cm2) to image the whole sample submitted to an applied stress or a thermal treatment, specially with the new synchrotron radiation (SR) topography cameras. The advent of this new powerful X-ray source has significantely enlarged the field of application of XRT which suffered in the past from the long exposures preventing real time experiments on evolving systems. A factor of about 100 in the intensity delivered by the SR sources compared to laboratory generators, together with the advances in X-ray video detec tors enable now to follow the transformations taking place in single crystals under controlled external stimulations. Examples dealing with growth processes from the melt or in the solid state, phase transformations, plastic deformation will be described in the following.

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Author information

Authors and Affiliations

  1. Laboratoire de Minéralogie-Cristallographie, associé au CNRA et aux Universités Paris VI et Paris VII, 4 Place Jussieu, 75230, Paris Cedex 05, France

    Michèle Sauvage-Simkin

  2. CNRS et Université Paris-Sud, 91405, Orsay, France

    Michèle Sauvage-Simkin

Authors
  1. Michèle Sauvage-Simkin
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Editor information

Editors and Affiliations

  1. University of Kent, Canterbury, England

    Alan V. Chadwick

  2. University of Calabria, Renole, Italy

    Mario Terenzi

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© 1986 Springer Science+Business Media New York

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Sauvage-Simkin, M. (1986). X-Ray Topography and Related Techniques Using Synchrotron Radiation. In: Chadwick, A.V., Terenzi, M. (eds) Defects in Solids. NATO ASI Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0761-8_8

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  • DOI: https://doi.org/10.1007/978-1-4757-0761-8_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-0763-2

  • Online ISBN: 978-1-4757-0761-8

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