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Transmission Electron Microscopy of Defects in Solids

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Defects in Solids

Part of the book series: NATO ASI Series ((NSSB))

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Abstract

Microscopy is based on the ability to retrieve spatial information about an object, usually in magnified form, from diffraction of radiation by the object. It differs from indirect structural probes such as spectroscopy, scattering, magnetic resonance, electrical or thermal conductivity measurements in that information about internal structure or composition of the object is averaged over at most one dimension of the object, providing at least two-dimensional mapping of structural features of interest, such as atomic arrangements or structural defects. Microscopy is therefore a direct technique for observing structure and sometimes composition of individual defects.

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Author information

Authors and Affiliations

  1. Massachusetts Institute of Technology, Cambridge, MA, 02139, USA

    Linn W. Hobbs

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  1. Linn W. Hobbs
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Editor information

Editors and Affiliations

  1. University of Kent, Canterbury, England

    Alan V. Chadwick

  2. University of Calabria, Renole, Italy

    Mario Terenzi

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© 1986 Springer Science+Business Media New York

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Hobbs, L.W. (1986). Transmission Electron Microscopy of Defects in Solids. In: Chadwick, A.V., Terenzi, M. (eds) Defects in Solids. NATO ASI Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0761-8_4

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  • DOI: https://doi.org/10.1007/978-1-4757-0761-8_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-0763-2

  • Online ISBN: 978-1-4757-0761-8

  • eBook Packages: Springer Book Archive

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