Transmission Electron Microscopy of Defects in Solids

  • Linn W. Hobbs
Part of the NATO ASI Series book series (NSSB)


Microscopy is based on the ability to retrieve spatial information about an object, usually in magnified form, from diffraction of radiation by the object. It differs from indirect structural probes such as spectroscopy, scattering, magnetic resonance, electrical or thermal conductivity measurements in that information about internal structure or composition of the object is averaged over at most one dimension of the object, providing at least two-dimensional mapping of structural features of interest, such as atomic arrangements or structural defects. Microscopy is therefore a direct technique for observing structure and sometimes composition of individual defects.


Scanning Transmission Electron Microscope Chromatic Aberration Bloch Wave Dispersion Surface Reciprocal Lattice Point 
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Copyright information

© Springer Science+Business Media New York 1986

Authors and Affiliations

  • Linn W. Hobbs
    • 1
  1. 1.Massachusetts Institute of TechnologyCambridgeUSA

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