A Method and Apparatus for Concentrating Trace Impurities in Analyzing Grade-A Helium
Increasing demand for helium containing less than 50 ppm total impurities for missile and atomic energy applications requires reliable determination of the trace impurities in Grade-A helium,** The impurities should be identified and their concentrations should be known within a tolerance of 1 ppm.
KeywordsLiquid Helium Total Impurity Trace Impurity Fixed Orifice Cryogenic Engineer
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