Abstract
It shall be the guiding purpose of this chapter to answer the question: What do I, as an experimentalist, need to get my job done? The answer to this question is indeed one of the overriding goals of the whole book, but in this chapter we shall concentrate our attention on the technical aspects of the problem. We shall first break down the basic operations of an electron spectrometer into their various components and discuss for each element the different ways in which the operation can be accomplished, and which of the ways is preferable in terms of results desired and cost, both in time and money. What can and cannot be done will be indicated, and at the conclusion I shall do some crystal-ball-gazing into what one might expect for the future in the way of new equipment and techniques.
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References
J. R. Pierce, Theory and Design of Electron Beams (D. Van Nostrand, New York, 1949), p. 186.
V. Hughes and H. L. Schultz, ed., Methods of Experimental Physics, IVA, Atomic Sources and Detectors (Academic Press, New York, 1967).
J. E. Holliday, in Soft X-Ray Spectrometry and Band Structures of Metals and Alloys, ed. by D. J. Farbian (Academic Press, London, New York, 1968), p. 101.
M. O. Krause, Chem. Phys. Lett. 10, 65 (1971).
M. O. Krause, private communication.
H. Fellner-Feldegg, U. Gelius, B. Wannberg, A. G. Nilsson, E. Basilier, and K. Siegbahn, J. Electron Spectros. 5, 643 (1974).
K. Siegbahn, in Electron Spectroscopy—Proc. Int. Conf., Asilomar, September 1971, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 15.
B. L. Henke and M. A. Tester, Advances in X-Ray Analysis, Vol. 18 (1975).
K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg, K. Hamerin, J. Hedman, G. Johansson, T. Bergmark, S.-E. Karlsson, I. Lindgren, and B. Lindberg, Electron Spectroscopy for Chemical Analysis—Atomic, Molecular, and Solid State Structure Studies by Means of Electron Spectroscopy (Almqvist and Wiksells Boktryekeri AB, Stockholm, Sweden, 1967); Nova Acta Regiae Soc. Sci. Upsaliensis, Ser. 1V 20 (1967).
K. Siegbahn, D. Hammond, H. Fellner-Feldegg, and E. F. Barnett, Science 176, 245 (1972).
R. P. Godwin, “Synchrotron Radiation as a Light Source,” in Springer Tracts in Modern Physics 51 (1970).
K. Codling, Rep. Prog. Phys. 36, 544 (1973).
D. L. Ederer, NBS, private communication.
K. Thimm, J. Electron Spectros. 5, 755 (1974).
E. M. Purcell (private communication), p. 31 in Godwin.(11)
D. E. Eastman and W. D. Grobman, Phys. Rev. Lett. 21, 1378 (1972)
P. Mitchell and K. Codling, Phys. Lett. 38A, 31 (1972).
M. J. Lynch, K. Codling, and A. B. Gardner, Phys. Lett. 43A, 213 (1973)
D. E. Eastman, W. D. Grobman, J. J. Freeouf, and M. Erbudak, Phys. Rev. B9, 3473 (1974)
T. Sagawa, R. Kato, S. Sato, M. Watanabe, T. Ishii, I. Nagakura, S. Kono, and S. Suzuki, J. Electron Spectros. 5, 551 (1974).
I. Lindau, P. Pianetta, S. Doniach, and W. E. Spicer (to be published).
J. W. Taylor, in Chemical Spectroscopy and Photochemistry in the Vacuum-Ultraviolet, ed. by S. C. Sandorfy, P. J. Ausloos, and M. B. Robin (Reidel, Boston, 1974), p. 543
K. Codling, Physica Scripta 9, 247 (1974).
J. A. R. Samson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, New York, 1967).
L. Åsbrink and J. W. Rabalais, Chem. Phys. Lett. 12, 182 (1971).
J. A. R. Samson, Rev. Sci. Instrum. 40, 1174 (1969).
R. T. Poole, J. Liesegang, R. C. G. Leckey, and J. G. Jenkin, J. Electron Spectros. 5, 773 (1974).
F. Burger and J. P. Maier, J. Electron Spectros. 5, 783 (1974).
D. W. Turner, private communication.
J. A. Kinsinger, W. L. Stebbings, R. A. Valenzi, and J. W. Taylor, Anal. Chem. 44, 773 (1972).
R. D. Deslattes, Jr., private communication.
K. Siegbahn, C. Nordling, G. Johansson, J. Hedman, P. F. Heden, K. Hamrin, U. Gelius, T. Bergmark, L. O. Werme, R. Manne, and Y. Baer, ESCA Applied to Free Molecules (North-Holland, Amsterdam-London, 1969).
C. R. Brundle, M. W. Roberts, D. Latham, and K. Yates, J. Electron Spectros. 3, 241 (1974).
R. M. Friedman, J. Gobel, J. Hudis, and M. L. Perlman, J. Electron Spectros. 1, 300 (1972/73).
D. J. Hnatowich, J. Hudis, M. L. Perlman, and R. C. Ragaini, J. Appl. Phys. 42, 4883 (1971).
D. Betteridge, J. C. Carver, and D. M. Hercules, J. Electron Spectros. 2, 327 (1973)
D. S. Urch and M. Webber, J. Electron Spectros. 5, 792 (1974).
C. K. Jørgensen, Chimia 25, 213 (1971).
W. E. Swartz, Jr., P. H. Watts, Jr., J. C. Watts, J. M. Brasch, and E. R. Lippincott, Anal. Chem. 44, 2001 (1972).
J. L. Ogilvie and A. Wolberg, Appl. Spect. 26, 401 (1972).
S. Evans, Chem. Phys. Lett. 23, 134 (1973).
P. H. Citrin and T. D. Thomas, J. Chem. Phys. 57, 4446 (1972).
G. Grimvall, Physica Scripta 9, 43 (1974).
D. A. Huchital and R. T. McKeon, Appl. Phys. Lett. 20, 158 (1972).
D. T. Clark, D. Kilcast, and W. K. R. Musgrave, J. Chem. Soc. D: Chem. Comm. 1971, 516.
C. S. Fadley and D. A. Shirley, J. Res. NBS, Phys. Chem. 74A, 543 (1970).
H. Siegbahn, L. Asplund, P. Kelfve, K. Hamrin, L. Karlsson, and K. Siegbahn, J. Electron Spectros. 5, 1059 (1974)
H. Siegbahn and K. Siegbahn, J. Electron Spectros. 2, 319 (1973).
J. Berkowitz and H. Ehrhardt, Phys. Lett. 21, 531 (1966)
J. Berkowitz, H. Ehrhardt, and T. Tekaat, Z. Physik 200, 69 (1967).
J. A. R. Samson, Phil. Trans. R. Soc. Lond. A268, 141 (1970).
D. A. Vroom, A. R. Comeaux, and J. W. McGowan, Chem. Phys. Lett. 3, 476 (1969).
T. A. Carlson and A. E. Jonas, J. Chem. Phys. 55, 4913 (1971).
D. C. Mason, A. Kuppermann, and D. M. Mintz, in Electron Spectroscopy, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 269.
R. Morgenstern, A. Niehaus, and M. W. Ruf, Chem. Phys. Lett. 4, 635 (1970).
M. O. Krause, Phys. Rev. 177, 151 (1969).
D. L. Ames, J. P. Maier, F. Watt, and D. W. Turner, Faraday Disc. Chem. Soc. 54, 277 (1972).
B. P. Pullen, T. A. Carlson, W. E. Moddeman, G. K. Schweitzer, W. E. Bull, and F. A. Grimm, J. Chem. Phys. 53, 768 (1970).
J. C. Helmer and N. H. Weichert, Appl. Phys. Lett. 13, 266 (1968).
M. J. Weiss, J. Electron Spectros. 1, 179 (1972/73).
B. Wannberg, U. Gelius, and K. Siegbahn, J. Phys. E 7, 149 (1974)
M. E. Gellender and A. D. Baker, J. Electron Spectros. 4, 249 (1974)
F. H. Read, J. Comer, R. E. Imhof, J. N. H. Brunt, and E. Harting, J. Electron Spectros. 4, 293 (1974).
H. Z. Sarel, Rev. Sci. Instr. 38, 1210 (1967).
H. Hafner, J. A. Simpson, and C. E. Kuyatt, Rev. Sci. Instr. 39, 33 (1968).
D. E. Golden and A. Zecca, Rev. Sci. Instr. 42, 210 (1971).
J. D. Lee, Rev. Sci. Instr. 43, 2191 (1972)
W. M. Riggs and R. P. Fedchenko, Am. Lab. 4, 65 (1972).
K. D. Sevier, Low Energy Electron Spectrometry (Wiley-Interscience, New York, 1972).
K. Siegbahn, ed., Alpha-, Beta-, and Gamma-Ray Spectroscopy (North-Holland, Amsterdam, 1965).
C. S. Fadley, R. N. Healey, J. M. Hollander, and C. E. Miner, Electron Spectroscopy, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 121.
D. Betteridge, A. D. Baker, P. Bye, S. K. Hasannudin, N. R. Kemp, and M. Thompson, J. Electron Spectros. 4, 163 (1974).
P. H. Citrin, R. W. Shaw, Jr., and T. D. Thomas, in Electron Spectroscopy, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 105
S. Aksela, Rev. Sci. Instr. 42, 810 (1971)
J. L. Gardner and J. A. R. Samson, J. Electron Spectros. 2, 267 (1973).
J. D. Allen, Jr., J. P. Wolfe, and G. K. Schweitzer, Int. J. Mass. Spectrom. Ion Phys. 8, 81 (1972).
H. Boersch, J. Geiger, and W. Stickel, Z. Physik 180, 415 (1964).
B. Tsai, T. Baer, and M. L. Horovitz, Rev. Sci. Instrum. 45, 494 (1974).
J. Berkowitz, J. Chem. Phys. 56, 2766 (1972)
S. Evans, A. F. Orchard, and D. W. Turner, Int. J. Mass Spectrom. Ion Phys. 7, 261 (1971); Y. S. Khodeyev, H. Siegbahn, K. Hamrin, and K. Siegbahn, University of Uppsala report UUIP-802 (1972).
C. J. Danby and J. H. D. Eland, Int. J. Mass Spectrom. Ion Phys. 8, 153 (1972)
J. Daintith, J. P. Maier, D. A. Sweigart, and D. W. Turner, in Electron Spectroscopy, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 289.
R. E. Ballard, and G. A. Griffiths, in Electron Spectroscopy, ed. by D. A. Shirley (North-Holland, Amsterdam, 1972), p. 151.
C. D. Moak, S. Datz, F. Garcia Santibáñez, and T. A. Carlson, J. Electron Spectros. 6, 151 (1975).
J. A. Decker and M. O. Harwit, Appl. Optics 7, 2205 (1968); 8, 2552 (1969).
J. D. Allen, Jr. and G. K. Schweitzer, J. Electron Spectros. 1, 507 (1972/73).
L. D. Hulett and M. T. Kelley, unpublished calculations.
T. D. Thomas, J. Electron Spectros. 6, 81 (1975).
M. O. Krause and J. Tarrant, private communication.
H. Ebel and N. Gurker, J. Electron Spectros. 5, 799 (1974)
G. K. Wertheim, J. Electron Spectros. 6, 239 (1975).
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Carlson, T.A. (1975). Instrumentation and Experimental Procedures. In: Photoelectron and Auger Spectroscopy. Modern Analytical Chemistry. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0118-0_2
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