Abstract
The study of the structure of the electrode/electrolyte (or more generally the solid/electrolyte) interface1,2 represents a problem of both fundamental and practical importance in electrochemistry and many other interfacial disciplines since its properties greatly affect (and often control) reactivity. Its importance relates to a broad range of problems including corrosion, catalysis, fuel cells, the potential and ionic gradients at charged interfaces including colloids and biological membranes, and many others. This problem has, until recently, proved very elusive to experimental study due to the difficulty of applying structure-sensitive techniques to the study of surfaces in contact with a condensed phase. Thus, most of our knowledge of the structure of the electrode/solution interface is based on indirect evidence which relies primarily on theoretical models to explain thermodynamic, spectroscopic, and kinetic data.
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References
M. J. Sparnaay, “The Electrical Double Layer,” in The International Encyclopedia of Physical Chemistry and Chemical Physics, Vol. 14, Pergamon Press, Glasgow, 1972.
J. O’M. Bockris, B. E. Conway, and E. Yeager, Comprehensive Treatise of Electrochemistry, Vol. 1, Plenum Press, New York, 1980.
T. E. Furtak, K. L. KJiewar, and D. W. Lynch, Eds., Proceedings of the International Conference on Non-Traditional Approaches to the Study of the Solid Electrolyte Interface, Surf Sci. 101 (1980).
See J. Electroanal. Chem. 150 (1983).
M. Fleischmann, P. J. Hendra, and A. J. McQuillan, Chem. Phys. Lett. 26 (1974) 173
M. Fleischmann, P. J. Hendra, and A. J. McQuillan, J. Electroanal. Chem. 65 (1975) 933.
D. J. Jeanmarie and R. P. Van Duyne, J. Electroanal. Chem. 84 (1977) 1.
R. P. Van Duyne, in Chemical and Biological Applications of Lasers, Vol. 4, Ed. by C. B. Moore, Academic, New York, 1979.
S. Pons, J. Electroanal. Chem. 150 (1983) 495.
A. Bewick, J. Electroanal. Chem. 150 (1983) 481.
C. K. Chen, T. F. Heinz, D. Ricard, and Y. R. Shen, Phys. Rev. Lett. 46 (1981) 1010.
R. M. Corn and M. Philpott, J. Chem. Phys. 81 (1984) 4138.
G. L. Richmond, Surf. Sci. 147 (1984) 115.
J. D. E. Mclntyre, in Advances in Electrochemistry and Electrochemical Engineering, Ed. by R. H. Muller, Wiley-Interscience, New York, 1973.
D. M. Kolb and H. Gerischer, Electrochim. Acta 18 (1973) 987.
A. T. Hubbard, Accounts. Chem. Res. 13 (1980) 177.
E. B. Yeager, J. Electroanal. Chem. 128 (1981) 1600.
P. N. Ross, Surf Sci. 102 (1981) 463.
H. Winick and S. Doniach, Eds., Synchrotron Radiation Research, Plenum Press, New York, 1980.
H. Winick, in Synchrotron Radiation Research, Ed. by H. Winick and S. Doniach, Plenum Press, New York, 1980, p. 11.
D. H. Tomboulian and P. Hartman, Phys. Rev. 102 (1956) 1423.
H. Winick, G. Brown, K. Halbach, and J. Harris, Physics Today (May 1981) 50.
E. A. Stern, Sci. Am. 234 (4) (1976) 96.
P. Eisenberger and B. M. Kincaid, Science 200 (1978) 1441.
S. P. Cramer and K. O. Hodgson, Prog. Inorg. Chem. 25 (1979) 1.
B. K. Teo, Accounts. Chem. Res. 13 (1980) 412.
P. A. Lee, P. H. Citrin, P. Eisenberger, and B. M. Kincaid, Rev. Mod. Phys. 53 (1981) 769.
B. K. Teo and D. C. Joy, Eds., EXAFS Spectroscopy, Techniques and Applications, Plenum Press, New York, 1981.
A. Bianconi, L. Inoccia, and S. Stippich, Eds., EXAFS and Near Edge Structure, Springer-Verlag, Berlin, 1983.
K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Eds., EXAFS and Near Edge Structure III, Springer-Verlag, Berlin, 1984.
B. K. Teo, EXAFS: Basic Principles and Data Analysis, Springer-Verlag, Berlin, 1986.
R. de L. Kronig, Z. Phys. 70 (1931) 317; 75 (1932) 191, 468.
D. E. Sayers, E. A. Stern, and F. W. Lytle, Phys. Rev. Lett. 27 (1971) 1204.
E. A. Stern, Phys. Rev. B 10 (1974) 3027.
E. A. Stern, D. E. Sayers, and F. W. Lytle, Phys. Rev. B 11 (1975) 4836.
C. A. Ashby and S. Doniach, Phys. Rev. B 11 (1975) 1279.
P. A. Lee and J. B. Pendry, Phys. Rev. B 11 (1975) 2795.
P. A. Lee and G. Beni, Phys. Rev. B 15 (1977) 2862.
P. Eisenberger and G. S. Brown, Solid State Commun. 29 (1979) 481.
T. M. Hayes, J. W. Allen, J. Tauc, B. G. Giessen, and J. J. Hauser, Phys. Rev. Lett. 40 (1978) 1282.
T. M. Hayes, J. B. Boyce, and J. L. Beeby, J. Phys. C 11 (1978) 2931.
P. A. Lee and G. Beni, Phys. Rev. B 15 (1977) 2682.
T. M. Hayes, P. N. Sen, and S. H. Hunter, J. Phys. C 9 (1976) 4357.
S. P. Cramer, J. H. Dawson, K. O. Hodgson, and L. P. Hager, J. Am. Chem. Soc. 100(1978) 7282.
S. P. Cramer, W. O. Gillum, K. O. Hodgson, L. E. Mortenson, E. I. Stiefel, J. R. Chisnell, J. W. Brill, and V. K. Shah, J. Am. Chem. Soc. 100 (1978) 3814.
S. P. Cramer, K. O. Hodgson, E. I. Stiefel, and W. E. Newton, J. Am. Chem. Soc. 100 (1978) 2748.
T. Tullius, P. Frank, and K. O. Hodgson, Proc. Natl. Acad. Sci. USA 75 (1978) 4069.
C. A. Ashby and S. Doniach, Phys. Rev. B 11 (1975) 1279.
R. F. Pettifer and P. W. McMillan, Phil. Mag. 35 (1977) 871.
P. Lagarde, Phys. Rev. B 13 (1976) 741.
B. K. Teo and P. A. Lee, J. Am. Chem. Soc. 101 (1979) 2815.
P. H. Citrin, P. Eisenberger, and B. M. Kincaid, Phys. Rev. Lett. 36 (1976) 1346.
E. A. Stern, J. Vac. Sci. Technol. 14 (1977) 461.
U. Landman and D. L. Adams, J. Vac. Sci. Technol. 14 (1977) 466.
J. Stohr, in Emission and Scattering Techniques Studies of Inorganic Molecules, Solids and Surfaces, Ed. by P. Day, Reidel, Dordrecht, 1981.
J. Hasse, Appl. Phys. A 38 (1985) 181.
P. H. Citrin, J. Phys. (Paris), Colloq. 47 (C8), (1986) 437.
P. A. Lee, Phys. Rev. B 13 (1976) 5261.
J. Jaklevic, J. A. Kirby, M. P. Klein, A. S. Robertson, A. S. Brown, and P. Eisenberger, Solid State Commun. 23 (1977) 679.
J. B. Hastings, P. Eisenberger, B. Lengler, and M. L. Perlman, Phys. Rev. Lett. 43 (1979) 1807.
S. M. Heald, E. Keller, and E. A. Stern, Phys. Lett. 103A (1984) 155.
R. W. James, The Optical Principles of the Diffraction of X-rays, Oxbow Press, Woodbridge, Connecticut, 1982.
See also: D. H. Bilderback, SPIE Proc. 315 (1982) 90.
E. Dartyge, A. Fontaine, A. Jucha, and D. Sayers, in EXAFS and Near Edge Structure III, Ed. by K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Springer-Verlag, Berlin, 1984, p. 472.
A. M. Flank, A. Fontaine, A. Jucha, M. Lemmonier, and C. Williams, in EXAFS and Near Edge Structure, Ed. by A. Bianconi, L. Inoccia, and S. Stippich, Springer-Verlag, Berlin, 1983, p. 405.
D. E. Sayers, D. Bazin, H. Dexpert, A. Jucha, E. Dartyge, A. Fontaine, and P. Lagarde, EXAFS and Near Edge Structure, Ed. by A. Bianconi, L. Froccia, and S. Stippich, Springer-Verlag, Berlin, 1983, p. 209.
H. Oyanagi, T. Matsushita, U. Kaminaga, and H. Hashimoto, J. Phys. (Paris), Colioq 47 (C8), (1986) 139.
S. Saigo, H. Oyanagi, T. Matsushita, H. Hashimoto, N. Yoshida, M. Fujimoto, T. Nagamura, J. Phys. (Paris), Colloq. 47 (C8) (1986) 555.
J. Mimault, R. Cortes, E. Dartyge, A. Fontaine, A. Jucha, D. Sayers, in EXAFS and Near Edge Structure III Ed. by K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Springer-Verlag, Berlin, 1984, p. 47.
W. E. O’Grady, J. Electrochem. Soc. 127 (1980) 555.
G. G. Long, J. Kruger, D. R. Black, and M. Kuriyama, J. Electrochem. Soc. 130 (1983) 240.
G. G. Long, J. Kruger, D. R. Black, and M. Kuriyama, J. Electroanal Chem. 150 (1983) 603.
G. G. Long, J. Kruger, and M. Kuriyama, in Passivity of Metals and Semiconductors, Ed. by M. Froment, Elsevier, Amsterdam, 1983, p. 139.
J. Kruger, G. G. Long, M. Kuriyama, and A. I. Goldman, in Passivity of Metals and Semiconductors, Ed. by M. Froment, Elsevier, Amsterdam, 1983, p. 163.
M. E. Kordesch and R. W. Hoffman, Nucl. Instrum. Methods Phys. Res. 222 (1984) 347.
R. W. Hoffman, in Passivity of Metals and Semiconductors, Ed. by M. Froment, Elsevier, Amsterdam, 1983, p. 147.
A. J. Forty, M. Kerkar, J. Robinson, and M. Ward, J. Phys. (Paris), Colioq. 47 (C8), (1986) 1077.
G. Martens and P. Rabe, Phys. Status Solidi A 58 (1980) 415.
L. Bosio, R. Cortes, A. Defrain, M. Froment, and A. M. Lebrun, in Passivity of Metals and Semiconductors, Ed. by M. Froment, Elsevier, Amsterdam, 1983, p. 131.
L. Bosio, R. Cortes, A. Defrain, and M. Froment, J. Electroanal. Chem. 180 (1984) 265.
L. Bosio, R. Cortes, and M. Froment, in EXAFS and Near Edge Structure III, Ed. by K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Springer-Verlag, Berlin, 1984, p. 484.
S. M. Heald, J. M. Tranquada, and H. Chen, J. Phys. (Paris), Colloq. 47 (C8), (1986) 825.
E. A. Stern, E. Keller, O. Petitpierre, L. E. Bouldin, S. M. Heald, and J. Tranquada, in EXAFS and Near Edge Structure III, Ed. by K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Springer-Verlag, Berlin, 1984, p. 261.
J. McBreen, W. E. O’Grady, K. I. Pandya, R. W. Hoffman, and D. E. Sayers, Langmuir 3 (1986)428.
D. M. Kolb, in Advances in Electrochemistry and Electrochemical Engineering, Vol. 11, Ed. by H. Gerischer and C. Tobias, Pergamon Press, New York, 1978, p. 125.
L. Blum, H. D. Abrufia, J. H. White, M. J. Albarelli, J. G. Gordon, G. Borges, M. Samant, and O. R. Melroy, J. Chem. Phys. 85 (1986) 6732.
O. R. Melroy, M. G. Samant, G. C. Borges, J. G. Gordon, L. Blum, J. H. White, M. J. Albarelli, M. McMillan, and H. D. Abrufia, J. Phys. Chem. 92 (1988) 4432.
J. H. White, M. J. Albarelli, H. D. Abrufia, L. Blum, O. R. Melroy, M. Samant, G. Borges, and J. G. Gordon, submitted.
M. G. Samant, G. L. Borges, J. G. Gordon, O. R. Melroy, and L. Blum, J. Am. Chem. Soc. 109 (1987) 5970.
J. H. White, M. J. Albarelli, M. McMillan, G. M. Bommarito, D. Acevedo, and H. D. Abruña, submitted.
D. W. Pashley, Phil. Mag. 4 (1959) 316.
E. Grunbaum, Vacuum 24 (1973) 153.
K. Reichelt and H. O. Lutz, J. Cryst. Growth 10 (1971) 103.
M. Zei, G. Qiao, G. Lehmpfhul, and D. M. Kolb, Ber. Bunsenges. Phys. Chem. 91 (1987) 349.
J. H. White, M. J. Albarelli, M. McMillan, M. G. Bommarito, D. Acevedo, and H. D. Abruña, unpublished results.
F. Lu, G. N. Salaita, H. Baltruschat, and A. T. Hubbard, J. Electroanai Chem. 222 (1987) 305.
D. A. Smith, M. J. Heeg, W. R. Heineman, and R. C. Elder, J. Am. Chem. Soc. 106 (1984) 3053.
D. A. Smith, R. C. Elder, and W. R. Heineman, Anal. Chem. 57 (1985) 2361.
H. D. Dewald, J. W. Watkins, R. C. Elder, and W. R. Heineman, Anal. Chem. 58 (1986) 2968.
W. R. Heineman, private communication.
M. R. Antonio, J. S. Wainwright, and O. J. Murphy, private communication.
M. J. Albarelli, J. H. White, M. McMillan, M. G. Bommarito, and H. D. Abruña, J. Electroanai. Chem. 248 (1988) 77.
G. Tourillon, E. Dartyge, H. Dexpert, A. Fontaine, A. Jucha, P. Lagarde, and D. E. Sayers, J. Electroanai. Chem. 178 (1984) 357.
G. Tourillon, E. Dartyge, H. Dexpert, A. Fontaine, A. Jucha, P. Lagarde, and D. E. Sayers, Surf. Sci. 156 (1985) 536.
H. Dexpert, P. Lagarde, and G. Tourillon, in EXAFS and Near Edge Structure III, Ed. by K. O. Hodgson, B. Hedman, and J. E. Penner-Hahn, Springer-Verlag, Berlin, 1984, p. 400.
G. Tourillon, E. Dartyge, A. Fontaine, and A. Jucha, Phys. Rev. Lett. 57 (1986) 603.
E. Dartyge, A. Fontaine, G. Tourillon, and A. Jucha, J. Phys. (Paris), Colloq. 47 (C8) (1986)607.
E. Dartyge, C. Depautex, J. M. Dubuisson, A. Fontaine, A. Jucha, P. Leboucher, and G. Tourillon, Nucl. Instrum. Methods Phys. Res. A246 (1986) 452.
E. Dartyge, A. Fontaine, G. Tourillon, R. Cortes, and A. Jucha, Phys. Lett. 113A (1986) 384.
A. Fontaine, E. Dartyge, A. Jucha, and G. Tourillon, Nucl. Instrum. Methods Phys. Res. A253 (1987) 519.
G. Tourillon, H. Dexpert, and P. Lagarde, J. Electrochem. Soc. 134 (1987) 327.
B. W. Batterman, and H. Cole, Rev. Mod. Phys. 36 (1964) 681.
B. W. Batterman, Phys. Rev. 133 (1964) A759.
T. W. Barbee and J. H. Underwood, Optics Commun. 48, (1983) 161.
M. J. Bedzyk and G. Materlik, Phys. Rev. B 31, (1985) 4110.
P. L. Cowan, J. A. Golovchenko, and M. F. Robbins, Phys. Rev. Lett. 44 (1980) 1680.
T. W. Barbee, in Low Energy X-ray Diagnostics—1981, Ed. by D. T. Atwood and B. L. Henke, AIP Press, New York, 1981.
T. W. Barbee and W. K. Warburton, Mater. Lett. 3 (1984) 17.
A. Iida, T. Matsushita, and T. Ishikawa, Jpn. J. Appl. Phys. 24 (1985) L675.
G. Materlik, J. Zegenhagen, and W. Uelhoff, Phys. Rev. B 32 (1985) 5502.
G. Materlik, M. Schmah, J. Zegenhagen, and W. Uelhoff, Ber. Bunsenges. Phys. Chem. 91 (1987) 292.
M. J. Bedzyk, D. Bilderback, J. H. White, H. D. Abruna, and M. G. Bommarito, J. Phys. Chem. 90 (1986) 4926.
J. L. Stickney, S. D. Rosasco, and A. T. Hubbard, J. Electrochem. Soc. 131 (1984) 260.
J. L. Stickney, S. D. Rosasco, B. C. Schardt, and A. T. Hubbard, J. Phys. Chem. 88 (1984) 251.
D. P. Woodruff, D. L. Seymour, C. F. McConville, C. E. Riley, M. D. Crapper, N. P. Prince, and R. G. Jones, Phys. Rev. Lett. 58 (1987) 1460.
M. J. Bedzyk and H. D. Abruna, unpublished results.
S. U. Falk, J. Electrochem. Soc. 107 (1960) 661.
A. J. Salkind, C. J. Venuto, and S. U. Falk, J. Electrochem. Soc. 111 (1964) 493.
K. Machida and M. Enyo, Chem. Lett. (1986) 1437.
G. Nazri and R. H. Muller, J. Electrochem. Soc. 132 (1985) 1385.
W. C. Marra, P. Eisenberger, and A. Y. Cho, J. Appl. Phys. 50 (1979) 6927.
P. Eisenberger and W. C. Marra, Phys. Rev. Lett. 46 (1981) 1081.
W. C. Marra, P. H. Fuoss, and P. Eisenberger, Phys. Rev. Lett. 49 (1982) 1169.
I. K. Robinson, Phys. Rev. B 33 (1986) 3830.
M. Fleischmann, P. J. Hendra, and J. Robinson, Nature 288 (1980) 152.
M. Fleischmann, A. Oliver, and J. Robinson, Electrochim. Acta 31 (1986) 899.
M. Fleischmann, P. Graves, I. Hill, A. Oliver, and J. Robinson, J. Electroanal. Chem. 150 (1983) 33.
M. Fleischmann and B. W. Mao, J. Electroanal. Chem. 229 (1987) 125.
M. G. Samant, M. F. Toney, G. L. Borges, L. Blum, and O. R. Melroy, J. Am. Chem. Soc. J. Phys. Chem. 92 (1988) 220.
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Abruña, H.D. (1989). X Rays as Probes of Electrochemical Interfaces. In: Bockris, J.O., White, R.E., Conway, B.E. (eds) Modern Aspects of Electrochemistry No. 20. Modern Aspects of Electrochemistry, vol 20. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-8762-6_4
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