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The Measurement of Infrared Emission Spectra Using Multiple-Scan Interferometry

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Part of the book series: Developments in Applied Spectroscopy ((DAIS,volume 5))

Abstract

A multiple-scan interference spectrometer is described, as are exploratory experiments with the application of the instrument to observe low-temperature emission spectra of various substances, The instrument is highly senstive and could be used for transmission, reflection, and emission spectroscopy, especially in situations where the signals obtained are weak.

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References

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© 1966 Chicago Section of the Society for Applied Spectroscopy

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Low, M.J.D., Coleman, I. (1966). The Measurement of Infrared Emission Spectra Using Multiple-Scan Interferometry. In: Pearson, L.R., Grove, E.L. (eds) Developments in Applied Spectroscopy. Developments in Applied Spectroscopy, vol 5. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-8694-0_12

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  • DOI: https://doi.org/10.1007/978-1-4684-8694-0_12

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-8696-4

  • Online ISBN: 978-1-4684-8694-0

  • eBook Packages: Springer Book Archive

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