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Developments in Applied Spectroscopy pp 199–215Cite as

Direct Spectrographic Determination of Trace Impurities in Ultrahigh-Purity Silver Nitrate Crystals

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Part of the book series: Developments in Applied Spectroscopy ((DAIS,volume 8))

Abstract

A direct spectrographic method is described for the determination of 25 trace impurities in ultrahigh-purity silver nitrate crystals with limits of sensitivities for many elements in the range 0.005–5.0 ppm. Through the use of spectrographic buffers and specially designed electrodes, it has been possible to increase the sensitivity by several orders of magnitude for a number of impurities and to achieve sensitivities equivalent to concentration ranges previously obtained by chemical concentration of certain other impurities prior to spectrographic analysis. Conditions of analysis, volatilization studies, analytical curves, and limits of sensitivities are presented. The average precision is 19%, expressed as coefficient of variation.

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References

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Author information

Authors and Affiliations

  1. Instrumental Analysis Laboratory Engelhard Industries Division, Engelhard Minerals & Chemicals Corporation, Newark, New Jersey, USA

    V. Le Roy & A. J. Lincoln

Authors
  1. V. Le Roy
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  2. A. J. Lincoln
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Editor information

Editors and Affiliations

  1. Research Laboratories, Illinois Institute of Technology, Chicago, Illinois, USA

    E. L. Grove

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© 1970 Chicago Section of the Society for Applied Spectroscopy

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Le Roy, V., Lincoln, A.J. (1970). Direct Spectrographic Determination of Trace Impurities in Ultrahigh-Purity Silver Nitrate Crystals. In: Grove, E.L. (eds) Developments in Applied Spectroscopy. Developments in Applied Spectroscopy, vol 8. Springer, New York, NY. https://doi.org/10.1007/978-1-4684-7962-1_18

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  • DOI: https://doi.org/10.1007/978-1-4684-7962-1_18

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4684-7964-5

  • Online ISBN: 978-1-4684-7962-1

  • eBook Packages: Springer Book Archive

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