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An Electron Microscopy and X-Ray Study of the Recovery on Annealing of Cold-Worked, Dispersion-Strengthened Alloys

  • R. Grierson
  • L. J. Bonis
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  • 118 Downloads

Abstract

A study of the effect of high-temperature anneals on the internal structure of heavily cold-worked TD nickel has been carried out. Transmission electron microscopy was used in order to study the dislocation structure of this material. A Fourier analysis of the broadening of X-ray diffraction lines has been carried out, with the aid of a computer, in order to study the internal strains and the size of the coherently diffracting domains. The relationships between the dislocation structure, internal strains, and size of coherently diffracting domains are discussed.

Keywords

Elastic Strain Diffraction Line Pure Nickel Extrusion Direction Nickel Matrix 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Doble, G. S., and R. J. Quigg, Trans. Met. Soc. AIME 233: 410 (1965).Google Scholar
  2. 2.
    White, J. E., and R. D. Carnahan, Trans. Met. Soc. AIME 230: 1298 (1964).Google Scholar
  3. 3.
    Inman, M. C., K. M. Zwilsky, and D. H. Boone, ASM, Trans. Quart. 57: 701 (1964).Google Scholar
  4. 4.
    von Heimendahl, M., and G. Thomas, Trans. Met. Soc. AIME 230: 1520 (1964).Google Scholar
  5. 5.
    Ashby, M. F., and L. M. Brown, Phil. Mag. 8: 1083, 1649 (1963).CrossRefGoogle Scholar
  6. 6.
    Ashby, M. F., and L. M. Brown, Fifth International Congress for Electron Microscopy, Vol. I, Academic Press Inc. (New York), 1962.Google Scholar
  7. 7.
    Becher, J. J., Trans. Met. Soc. AIME 209: 59 (1957).Google Scholar
  8. 8.
    Bean, C. P., and J. D. Livingston, J. Appl. Phys. 30: 1205 (1959).CrossRefGoogle Scholar
  9. 9.
    Phillips, V. A., and J. D. Livingston, Phil. Mag. 7: 969 (1962).CrossRefGoogle Scholar
  10. 10.
    Ashby, M. F., and G. C. Smith, J. Inst. Metals 91: 182 (1962–1963).Google Scholar
  11. 11.
    Ashby, M. F., Fifth International Congress for Electron Microscopy, Vol. I, Academic Press Inc. (New York), 1962.Google Scholar
  12. 12.
    Goodrich, R. S., and G. S. Ansell, Trans. Met. Soc. AIME 230: 1372 (1964).Google Scholar
  13. 13.
    Reviewed in X-Ray Studies of Deformed Metals; B. E. Warren, Progr. Metal Phys. 8: 147 (1959).CrossRefGoogle Scholar
  14. 14.
    Paterson, M. S., J. Appl. Phys. 23: 805 (1952).CrossRefGoogle Scholar
  15. 15.
    Cohen, J. B., and C. N. J. Wagner, J. Appl. Phys. 33: 2073 (1962).CrossRefGoogle Scholar
  16. 16.
    Schoening, F. R. L., and J. N. van Niekerk, Acta Met. 3: 10–13 (1955).CrossRefGoogle Scholar
  17. 17.
    Wagner, C. N. J., Acta Met. 5: 427 (1957).CrossRefGoogle Scholar
  18. 18.
    Wagner, C. N. J., Acta Met. 5: 477 (1957).CrossRefGoogle Scholar
  19. 19.
    Mitchell, D., and F D. Haig, Phil. Mag. 3: 15 (1957).CrossRefGoogle Scholar
  20. 1.
    Doble, G. S., and R. J. Quigg, Trans. Met. Soc. AIME 233: 410–415 (1965).Google Scholar
  21. 2.
    Dromsky, J. A., and F. V. Lenel, Trans. Met. Soc. AIME 230: 1289–1293 (1964).Google Scholar
  22. 3.
    Inman, M. C., K. M. Zwilsky, and D. H. Boone, ASM Trans. Quart. 57: 701–713 (1964).Google Scholar
  23. 4.
    von Heimendahl, M., and G. Thomas, Trans. Met. Soc. AIME 230: 1520–1528 (1964).Google Scholar

Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • R. Grierson
    • 1
  • L. J. Bonis
    • 1
  1. 1.Ilikon Corp.NatickUSA

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