Abstract
The ellipsometric technique was first used to measure helium film thicknesses by Burge and Jackson1 in 1951, and ellipsometric measurements of the film have been reported sporadically over the past two decades.
This work was supported by the Science Research Council.
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References
E. J. Burge and L. C. Jackson, Proc. Roy. Soc. A. 205, 270 (1951).
C. C. Matheson, J. G. Wright, H. Norris, and R. Gundermann, to be published.
D. G. Blair and C. C. Matheson, Cryogenics 10, 513 (1970).
F. L. McCrackin, NBS Tech. Note 479 (1969).
M. H. Edwards, Can. J. Phys. 36, 884 (1958).
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Matheson, C.C., Horn, J.L. (1974). Ellipsometric Measurements of the Saturated Helium Film. In: Timmerhaus, K.D., O’Sullivan, W.J., Hammel, E.F. (eds) Low Temperature Physics-LT 13. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7864-8_36
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DOI: https://doi.org/10.1007/978-1-4684-7864-8_36
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