Abstract
Lead stearate and lead lignocerate multilayer soap-film structures are used to disperse the K emission lines of boron and beryllium respectively. Data are presented showing the dependence of the peak height and half-width on the number of layers in the lignocerate structure. Spectra are presented and compared for the pure element and several compounds of each element. Both electron and X-ray excitation are used. Detection is by a thin-window flow-proportional counter.
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References
D. Coster and S. Hof, “On the Emission Spectra of Some Oxides and Pure Elements in the Soft X-Ray Region,” Physica 7: 655, 1940.
R. S. Crisp and S. E. Williams, “Soft X-ray Emission Spectra of Sodium, Beryllium, Silicon, and Lithium,” Phil. Mag. 6: 365, 1961.
D. W. Fischer and W. L. Baun, “The Effect of Chemical Combination on Long Wavelength K and L X-Ray Spectra,” presented at 16th Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, March, 1965.
E. Gwinner and H. Kiessig, “The Influence of Binding Energy on the Boron K Lines,” Z. Physik. 107: 449, 1937.
A. Hautot and J. Serpe, “On the K Emission Line of Boron,” J. Phys. radium 8: 175, 1937.
H. W. B. Skinner, “The Soft X-Ray Spectroscopy of Solids. I K- and L-Emission Spectra from Elements of the First Two Groups,” Phil. Trans. Roy. Soc. London Ser. A 239: 95, 1940.
H. W. B. Skinner, and J. E. Johnston, “Soft X-Ray Bands from Dilute Alloys,” Proc. Cambridge Phil. Soc. 34: 109, 1938.
R. A. Mattson, “Some Measurements of Carbon K Excitation in a New Ultrasoft X-Ray Spectrometer,” Advances in X-Ray Analysis, Vol. 8, p. 333, University of Denver, Plenum Press, New York, 1965.
R. C. Ehlert, “The Diffraction of X-Rays by Multilayer Stearate Soap Films,” in: W. M. Mueller, G. R. Mallett, and M. J. Fay (eds.), Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 325.
R. C. Ehlert, “Overturning of Monolayers,” J. Colloid Sci. 20: (4) 387, 1965.
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Ehlert, R.C., Mattson, R.A. (1966). The Characteristic X-Rays from Boron and Beryllium. In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_41
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DOI: https://doi.org/10.1007/978-1-4684-7633-0_41
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