Abstract
A two-crystal spectrometer employing a Cole polarizer made from a germanium crystal as one of the crystals is described. Experimental tests show that placing the polarizer crystal in the second position markedly improves the degree of plane polarization, in full agreement with the predictions of the dynamical theory of X-ray diffraction. Tests indicate that the twice-diffracted beam is better than 95% plane polarized. The angular resolving power of the instrument is comparable to that of conventional two-crystal spectrometers. The almost wholly plane-polarized monochromatic X-radiation, moreover, permits certain tests to be carried out far more effectively than is possible with partly polarized X-ray beams.
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© 1966 Springer Science+Business Media New York
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Donahue, R.J., Azároff, L.V. (1966). Plane-Polarized, Two-Crystal X-ray Spectrometer. In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_22
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DOI: https://doi.org/10.1007/978-1-4684-7633-0_22
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-7635-4
Online ISBN: 978-1-4684-7633-0
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