Abstract
A two-crystal spectrometer that makes full use of conventional diffractometer or spectrometer motions has been constructed so that it can be easily attached to a commercial instrument. The requisite degree of parallelism of the two crystal-rotation axes is maintained by keeping both parallel to a single ground surface. Special alignment aids have been constructed to facilitate the rapid alignment of the instrument, which can be operated manually in 1” intervals or used for automatic scanning in steps of 0.01°. Some guide lines for comparing the relative performance of spectrometers in X-ray absorption spectroscopy are suggested.
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References
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Azároff, L.V. (1966). Two-Crystal X-Ray Spectrometer Attachment. In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_21
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DOI: https://doi.org/10.1007/978-1-4684-7633-0_21
Publisher Name: Springer, Boston, MA
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