Abstract
A modification of the scanning X-ray topographic camera is reported. The specimen and photoplate are traversed back and forth independently in two directions rather than in the same direction as in the case of Lang’s camera. The distortions of the photographs caused by geometrical arrangement can be eliminated through this construction so as to have a one-to-one correspondence. Examples of reflection photographs as well as transmission photographs are shown. Some of them are compared with those taken using Lang’s camera. The dislocation images in the reflection photographs show a good one-to-one correspondence to those in the transmission photographs. The broadening of the dislocation images in the traversing direction is discussed. The present camera is especially useful for the studies of lattice defects in the thick specimens because the reflection photographs can be easily taken.
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References
Wolfgang Berg, “An X-Ray Method for Study of Lattice Disturbances of Crystals,” Naturwiss. 19: 391–396, 1931.
C. S. Barrett, “A New Microscopy and its Potentialities,” Trans. AIME 161: 15–65, 1945.
J. B. Newkirk, “Observations of Dislocations and Other Imperfections by X-Ray Extinction Contrast,” Trans. AIME 215: 483–497, 1959.
A. R. Lang, “The Projection Topograph: A New Method in X-Ray Diffraction Microradiography,” Acta Cryst. 12: 249–250, 1959.
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© 1966 Springer Science+Business Media New York
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Yoshimatsu, M., Shibata, A., Kohra, K. (1966). A Modification of the Scanning X-Ray Topographic Camera (Lang’s Method). In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_2
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DOI: https://doi.org/10.1007/978-1-4684-7633-0_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-7635-4
Online ISBN: 978-1-4684-7633-0
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