Abstract
Deformation, introduced into niobium and tantalum specimens by wire drawing at room temperature, produced changes in the shape and position of X-ray diffraction peaks. The resultant peak profiles and locations of all available peaks were recorded using the Debye—Scherrer geometry on a modified diffractometer with crystal monochromated Cu K α1 radiation. The amount of deformation in the surface layers of both metals was’found to saturate essentially after only 20% reduction in area. The measured decrease in the lattice parameters of either material was attributed to a residual surface stress; the average value for the deformed saturated state for both tantalum and niobium wires corresponded to an equivalent longitudinal tensile stress of 35 ± 5 kg/mm2. Integral breadth measurements revealed approximately equal X-ray particle sizes in the ‹100› and ‹110› directions; the minimum particle size for the microstructures of both metals was around 200 Å and occurred after the first few draws.
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Adler, R.P.I., Otte, H.M. (1966). X-Ray Study of Wire-Drawn Niobium and Tantalum. In: Mallett, G.R., Fay, M.J., Mueller, W.M. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7633-0_10
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DOI: https://doi.org/10.1007/978-1-4684-7633-0_10
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