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Fluorescent X-ray Spectrography: Determination of Trace Elements

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Developments in Applied Spectroscopy

Part of the book series: Developments in Applied Spectroscopy ((DAIS,volume 1))

Abstract

Serious consideration should be given to the merits of using the available fluorescent X-ray spectrographic instrumentation and techniques for determining trace elements. Limits of detectability for trace elements in metal, oxide, solution, or mineral samples range from 0.1 to 100 ppm, depending on the element being determined, over-all sample composition, and complexity of the X-ray spectra; limits of detectability range from 0.01 to 1 μg for elements that have been preconcentrated by a chemical or physical process, for example, by ion-exchange membrane.

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Authors and Affiliations

  1. United States Department of the Interior, Bureau of Mines, College Park Metallurgy Research Center, College Park, Maryland, USA

    William J. Campbell & John W. Thatcher

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  1. William J. Campbell
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  2. John W. Thatcher
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W. D. Ashby

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© 1962 Society for Applied Spectroscopy

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Campbell, W.J., Thatcher, J.W. (1962). Fluorescent X-ray Spectrography: Determination of Trace Elements. In: Ashby, W.D. (eds) Developments in Applied Spectroscopy. Developments in Applied Spectroscopy, vol 1. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7621-7_4

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  • DOI: https://doi.org/10.1007/978-1-4684-7621-7_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7623-1

  • Online ISBN: 978-1-4684-7621-7

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