Abstract
Instrumentation designed to utilize the principles of X-ray emission optics will produce an output signal proportional to the amount of an element present in a material, whether the material is stationary or moving. Such instrumentation, therefore, is very well suited for continuous analysis of elements in a material flowing in a process line.
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© 1962 Society for Applied Spectroscopy
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Loranger, W.F. (1962). On-Line Process Analysis by X-ray Emission Techniques. In: Ashby, W.D. (eds) Developments in Applied Spectroscopy. Developments in Applied Spectroscopy, vol 1. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7621-7_14
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DOI: https://doi.org/10.1007/978-1-4684-7621-7_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-7623-1
Online ISBN: 978-1-4684-7621-7
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