Skip to main content
SpringerLink
Log in

Studies of Microstructures in High-Tc Superconductors by X-ray Absorption Techniques

  • Chapter
Superconductivity and Applications

  • 199 Accesses

Abstract

Fluorescence emission and total-electron-yield vs. grazing angle of incidence at fixed energy of incoming soft x-ray radiation, around O is absorption edge, for YBa2Cu3O7−δ and Bi2Sr2 CaCu2O8+x thin films on MgO and ZrO2substrates were investigated. Surface rms roughness and oxygen depth distribution were estimated. We have found that in these materials the information depth of microstructures derived from fluorescence yield and total-electron-yield is around 2500 Å and 100 Å, respectively.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
eBook
USD 16.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. A. Krol, C.J. Sher, and Y.H. Kao, Phys. Rev. B39:8579 (1988).

    Google Scholar 

  2. H. Sugiyama, Jap. Bull. Electr. Lab. 38:351 (1974).

    Google Scholar 

  3. B.K. Agrawal “X-Ray Spectroscopy” ed., Springer-Verlag, New York (1979).

    Google Scholar 

  4. G.C. Smith, A. Krol, and Y.H. Kao, to be published in Nucl. Instr. Meth.

    Google Scholar 

  5. M.P. Seah and W.A. Dench, Surface and Interface Analysis 1:2 (1979).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Physics and Astronomy and New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York, 14260, USA

    A. Krol, C. J. Sher, Z. H. Ming, C. S. Lin, L. W. Song & Y. H. Kao

  2. Instrumentation Division, Brookhaven National Laboratory, Upton, New York, 11973, USA

    G. C. Smith

  3. New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York, 14260, USA

    Y. Z. Zhu & D. T. Shaw

Authors
  1. A. Krol
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. C. J. Sher
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Z. H. Ming
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. C. S. Lin
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. L. W. Song
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Y. H. Kao
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. G. C. Smith
    View author publications

    You can also search for this author in PubMed Google Scholar

  8. Y. Z. Zhu
    View author publications

    You can also search for this author in PubMed Google Scholar

  9. D. T. Shaw
    View author publications

    You can also search for this author in PubMed Google Scholar

Editor information

Editors and Affiliations

  1. New York State Institute on Superconductivity, State University of New York at Buffalo, Buffalo, New York, USA

    Hoi S. Kwok , Yi-Han Kao  & David T. Shaw ,  & 

Rights and permissions

Reprints and permissions

Copyright information

© 1990 Springer Science+Business Media New York

About this chapter

Cite this chapter

Krol, A. et al. (1990). Studies of Microstructures in High-Tc Superconductors by X-ray Absorption Techniques. In: Kwok, H.S., Kao, YH., Shaw, D.T. (eds) Superconductivity and Applications. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-7565-4_25

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-7565-4_25

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-7567-8

  • Online ISBN: 978-1-4684-7565-4

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Search

Navigation