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Production of Carbon Cluster Beams and Their Characterisation by Time-of-Flight Mass Spectroscopy

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Part of the book series: NATO ASI Series ((NSSB,volume 266))

Abstract

Carbon clusters are of considerable interest because of their chemical and physical properties/1/, their occurrence e.g. in combustion flames/2/ and in laser ablation of solid carbon materials/e.g. 3-7/. Also, carbon clusters are discussed as being nuclei in CVD—diamond film growth and for their potential in a—C:H film growth by ion cluster beam deposition (ICBD). ICBD /8,9/ is an interesting alternative to established methods for thin film technology and has found applications e.g./9/ in silicon and compound semiconductor technology, opto—eléctronics and optical films. It has been suggested/10/ that ICBD is special in that cluster fragmentation at the surface occurs and the fragments move on the surface without penetration into or destruction of the surface, but they do have enough energy for chemical reactions.

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© 1991 Plenum Press, New York

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Busmann, HG., Gaber, H., Müller, T., Hertel, I.V. (1991). Production of Carbon Cluster Beams and Their Characterisation by Time-of-Flight Mass Spectroscopy. In: Clausing, R.E., Horton, L.L., Angus, J.C., Koidl, P. (eds) Diamond and Diamond-like Films and Coatings. NATO ASI Series, vol 266. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5967-8_16

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  • DOI: https://doi.org/10.1007/978-1-4684-5967-8_16

  • Publisher Name: Springer, Boston, MA

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