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Secondary Ion Mass Spectrometry — Fundamentals and Application to Heterogeneous Catalysis

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Book cover Fundamental Aspects of Heterogeneous Catalysis Studied by Particle Beams

Part of the book series: NATO ASI Series ((NSSB,volume 265))

Abstract

Secondary ion mass spectrometry, SIMS, is the mass spectrometry of atomic or molecular particles which are emitted (a process known as sputtering) when a surface, usually a solid although it may be a liquid, is bombarded by energetic primary particles. The primary particles may be electrons, ions, neutrals or photons. The secondary ions which are detected may be emitted from the surface in the ionised state or they may be initially emitted as neutrals to be post-ionised before analysis.

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Authors and Affiliations

  1. Centre for Surface and Materials Analysis, Department of Chemistry, University of Manchester Institute of Science and Technology, Manchester, M60 1QD, UK

    N. M. Reed & J. C. Vickerman

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  1. N. M. Reed
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  2. J. C. Vickerman
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Editors and Affiliations

  1. Eindhoven University of Technology, Eindhoven, The Netherlands

    H. H. Brongersma  & R. A. van Santen  & 

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© 1991 Plenum Press, New York

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Reed, N.M., Vickerman, J.C. (1991). Secondary Ion Mass Spectrometry — Fundamentals and Application to Heterogeneous Catalysis. In: Brongersma, H.H., van Santen, R.A. (eds) Fundamental Aspects of Heterogeneous Catalysis Studied by Particle Beams. NATO ASI Series, vol 265. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5964-7_27

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  • DOI: https://doi.org/10.1007/978-1-4684-5964-7_27

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-5966-1

  • Online ISBN: 978-1-4684-5964-7

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