Abstract
In recent years, several authors have discussed the effects of variations in diffraction conditions in Reflection High Energy Electron Diffraction (RHEED) on Auger electron or characteristic X-ray emission. Ichimiya and Takeuchi [1] in particular have recently observed a strong enhancement of the Auger electron production at the surface wave resonance (SWR) condition, in experiments on MgO under Ultra-high Vacuum (UHV) conditions. “Monolayer resonances” which increase the intensity of Bragg beams by as much as 100, have also been analyzed in Pt(111) by Marten and Meyer-Ehmsen [2]. A related theoretical and experimental study of Auger and backscattered electron production for low energy electrons (E < 2 kV) incident at near-normal incidence on bulk samples has also been given [3,4]. (Here many Bloch waves are excited, unlike the reflection case.) Experimental observations of channelling effects on backscattered electron production, and their uses to provide image contrast in a UHV scanning reflection electron microscope have also been reported [5]. For a recent analysis of the diffraction conditions required to excite the surface wave resonance condition, the reader is referred to the work of Ichimiya, Kambe and Lehumpfuhl [6]. Channeling effects on characteristic X-ray production in RHEED are further analyzed in Miyake and Hayakawa [7].
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References
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© 1988 Plenum Press, New York
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Spence, J.C.H., Kim, Y. (1988). Adatom Site Determination using Channeling Effects in RHEED on X-ray and Auger Electron Production. In: Larsen, P.K., Dobson, P.J. (eds) Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces. NATO ASI Series, vol 188. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5580-9_9
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DOI: https://doi.org/10.1007/978-1-4684-5580-9_9
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