Abstract
Reflection Electron Microscopy (REM) has mainly been used to observe flat, clean and crystalline surfaces with the aim of imaging monatomic steps and surface dislocations. These features can be qualitatively understood and more quantitative theories are currently being developed. Most REM studies have concentrated on semiconductors or noble metals on which it is relatively easy to prepare good crystalline surfaces but it is desirable to extend REM to look at a greater variety of samples. This would include surfaces that are chemically more reative, rougher or less crystalline and less homogeneous, such as those with overlayers or oxides. Most of the previous work has used conventional transmission electron microscopes (CTEMs) but the analytical facilities and generally better vacuum of scanning transmission electron microscopes (STEMs) make them a potentially powerful tool for surface studies. The results presented in this paper were obtained from a V.G.HB501 STEM and show how REM can be used to examine surface reactions and inhomogeneous samples.
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D. Imeson and R. H. Milne, Surface studies in the V.G. HB501 STEM, J.Microscop.Spectrosc.Electron 10:465 (1985).
J. M. Cowley, Image contrast in a transmission scanning electron microscope, Appl.Phys.Letters 15:58 (1969).
R. H. Milne and D. McMullan, Dynamic focusing for reflection microscopy in STEM, Inst.Phys.Conf.Ser.No 78 (EMAG ‘85):95 (1985).
J. M. Cowley and P. E. Hojlund Nielsen, Magnification variations in reflection electron microscopy using diffracted beams, Ultramicroscopy, 1:145 (1975).
D. Imeson, R. H. Milne, S. D. Berger, and D. McMullan, Secondary electron detection in the scanning transmission electron microscope, Ultramicroscopy, 17:243 (1985).
J. Lambe and S. L. McCarthy, Light emission from inelastic electron tunnelling, Phys.Rev.Letter 37:923 (1976).
B. Luks and D. L. Mills, Light emission from tunnel junctions: the role of the fast surface polariton, Phys.Rev. B. 22:5723 (1980).
R. H. Milne, Investigation of stepped copper surfaces RHEED, Surf.Sci. 122:474 (1982a).
R. H. Milne, A RHEED study of oxygen adsorbed on copper, Surf.Sci. 121:347 (1982b).
R. H. Milne and A. Howie, Electron microscopy of copper oxidation, Phil.Mag. 49:665 (1984).
J. Perderau and G. E. Rhead, LEED studies of adsorption on vicinal copper surfaces, Surf.Sci. 24:555 (1971).
T. Homma, T. Yoneoka, and S. Matsunaga, Nucleation and growth behavior of oxide on copper single crystals: their roles in kinetics, Jap.J.Appl.Phys.Suppl.2, Part 2:101 (1974).
T. Hsu and J. M. Cowley, Reflection electron microscopy of fcc metals, Ultramicroscopy 11:239 (1983).
M. E. Mochel, C. J. Humphreys, J. A. Eades, J. M. Mochel and Petford, A. K. Electron beam writing on a 20A scale in metal β-aluminas, Appl.Phys.Lett., 42:392 (1983).
R. H. Milne and T. W. Fan, Electron beam modifications of InP surfaces, J. Microscopy 147:75 (1987).
J. Olivier, P. Faulconnier and R. Poirier, Low-energy electron losses by plasmon excitations as control means of the growth of epitaxial layers, J.Appl.Phys. 51:4990 (1980).
A. K. Petford-Long and D. J. Smith, In situ oxidation processes for In III–V compound semiconductors studied by high-resolution electron microscopy. Phil.Mag.A. 54:837 (1986).
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© 1988 Plenum Press, New York
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Milne, R.H. (1988). Reflection Microscopy in a Scanning Transmission Electron Microscope. In: Larsen, P.K., Dobson, P.J. (eds) Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces. NATO ASI Series, vol 188. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5580-9_23
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DOI: https://doi.org/10.1007/978-1-4684-5580-9_23
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