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Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces pp 285–301Cite as

Reflection Electron Microscopy with Use of CTEM: Studies of Au Growth on Pt(111)

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Part of the book series: NATO ASI Series ((NSSB,volume 188))

Abstract

Reflection electron microscopy (REM) and reflection high energy electron diffration (RHEED) in ultra-high vacuum (UHV) conditions have been found to be very powerful methods for the studies of surface structures and surface dynamic processes on bulk crystals, although REM images are foreshortened and the resolution is limited to some extent. The history of REM and its characteristics have been recently reviewed by one of the present authors [K.Y.][1] and are described in this book by many authors. Therefore, in this paper, we briefly review the characteristics of REM-RHEED with the use of conventional transmission electron microscopes (CTEM) and illustrate them by a recent study of growth of Au on Pt(111) surfaces. Scanning REM using a small scanning probe and a small solid angle detector (Cowley, Ichikawa and Doi, Bennett and Johnson in this book) which is equivalent by reciprocity theory to REM using a CTEM is not described.

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Author information

Authors and Affiliations

  1. Physics Department, Tokyo Institute of Technology, Oh-Okayama, Tokyo 152, Japan

    K. Yagi, S. Ogawa & Y. Tanishiro

Authors
  1. K. Yagi
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  2. S. Ogawa
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  3. Y. Tanishiro
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Editor information

Editors and Affiliations

  1. Philips Research Laboratories, Eindhoven, The Netherlands

    P. K. Larsen

  2. Philips Research Laboratories, Redhill, UK

    P. J. Dobson

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© 1988 Plenum Press, New York

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Yagi, K., Ogawa, S., Tanishiro, Y. (1988). Reflection Electron Microscopy with Use of CTEM: Studies of Au Growth on Pt(111). In: Larsen, P.K., Dobson, P.J. (eds) Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces. NATO ASI Series, vol 188. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5580-9_21

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  • DOI: https://doi.org/10.1007/978-1-4684-5580-9_21

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-5582-3

  • Online ISBN: 978-1-4684-5580-9

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