Abstract
The most fascinating property of the Quantum Hall Effect (QHE) is the phenomenon that from a relatively simple experiment on a semiconductor a new type of electrical resistor R0 can be deduced which is independent of microscopic properties of the semiconductor and reproducable at a level of better than 10-6. In the recent publication of “The 1986 Adjustment of the Fundamental Physical Constants”1 one finds a new general constant, the quantized Hall resistance with a recommended value R0=(25812.8056±0.00012) Ohm. This value is identical with the ratio h/e2, the ratio between the Planck constant h and the square of the electron charge e. The surprising result is, that this universal constant R0 can be measured directly on a macroscopic system. In principle all Hall effect measurements in strong magnetic fields and low temperatures on a two- dimensional electron gas show the QHE. However, for the experimental realization of this quantum phenomenon one has to specify the condition “low temperature”, “high magnetic field” and “two-dimensional system”. The inversion layer at the Si-Si02 interface of a silicon MOS fieldeffect transistor is the classical example for a two-dimensional system2 but in a more general way all structures with a vanishing conductivity in one direction may be called two-dimensional electron gas. Even a superlattice with a macroscopic thickness of some micrometers can show two-dimensional properties if the periodicity of the superlattice leads to well separated minihands3. In this respect most of the structures discussed at this school are related to the physics of two-dimensional systems and can be used for a discussion of the quantum Hall effect. The reduced dimensionality is necessary in order to obtain gaps in the electronic spectrum.
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v. Klitzing, K. (1987). Physics and Applications of the Quantum Hall Effect. In: Mendez, E.E., von Klitzing, K. (eds) Physics and Applications of Quantum Wells and Superlattices. NATO ASI Series, vol 170. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5478-9_10
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DOI: https://doi.org/10.1007/978-1-4684-5478-9_10
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