Small Angle Neutron Scattering an NDE Tool

  • C. T. Oien


Small angle neutron scattering (SANS) is a method where the very small angle neutron scattering (2 θ ≈2° to 5°) profile from test specimens is recorded and analyzed. The analysis of the scattering profile is very similar to that already developed extensively for x-ray scattering. The method provides micro-structure information on test samples which correlates very well with traditional microstucture analysis methods like TEM and SEM. The main difference and advantage of SANS is that it is a bulk measurement as opposed to thin film or surface. Recent developments in the application of this powerful analytic tool have provided the potential to use this technique as an NDE tool. This paper presents a brief overview of the SANS technique, the developments which may allow the application of this technique to NDE problems, and a few examples of how this technique is being utilized at Sandia National Laboratories (SNLL) and elsewhere for microstructure investigation.


Sandia National Laboratory Small Angle Scattering Cold Neutron Scatter Profile Neutron Attenuation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    A. Guinier and G. Fournet, “Small Angle Scattering of X-Rays,” Wiley, New York (1955).Google Scholar
  2. 2.
    H. Herman, “Non-Destructive Evaluation of Materials with Gold Neutron Beams,” Report to Naval Air System Command, Washington, D.C., Contract No. N00119–77-M-0418, AD A053073 (1977).Google Scholar
  3. 3.
    “Handbook of Materials Testing Reactors and Associate Hot Laboratories in the European Community,” D. Reidel Publishing C. O., Boston (1981).Google Scholar
  4. 4.
    C. Jantzen, D. Schwahn, J. Schelten, H. Herman, “X-Ray and Neutron Small-Angle Scattering Study of Phase Decomposition of Amorphous SiO2-Al2O3” 4th International Small Angle Scattering Conference, Gatlinberg, Tenn. (1977).Google Scholar
  5. 5.
    P. Pizzi, “Application of Small-Angle Neutron Scattering to NDI of Materials and Manufactured Components,” AGARD Meeting, Structures and Materials Panel, “NDI Relationships to Aircraft Design and Materials” (1977).Google Scholar
  6. 6.
    S. P. Singhal, Thesis, Personal Communication, National Bureau of Standards.Google Scholar
  7. 7.
    G. J. Thomas, Sandia National Laboratories, Livermore, Personal Communication.Google Scholar

Copyright information

© Plenum Press, New York 1984

Authors and Affiliations

  • C. T. Oien
    • 1
  1. 1.Acceptance Technology DivisionSandia National LaboratoriesLivermoreUSA

Personalised recommendations