Abstract
A unique instrument for the x-ray diffraction (XRD) characterization of crystalline materials has been developed and is being applied to a number of studies of metallic components. The instrument is based upon a unique position sensitive scintillation detector (PSSD) for x-rays. The methodology for the application of this instrument to the single-exposure technique (SET) of x-ray stress measurement is described. A number of applications of the device to residual stress measurement and qualitative cold work damage assessment in metallic components are discussed and data from these applications presented. Also, the application of the PSSD instrument to texture measurement is described.
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© 1984 Plenum Press, New York
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Ruud, C.O. (1984). Application of a Position Sensitive Scintillation Detector to Nondestructive X-Ray Diffraction Characterization of Metallic Components. In: Ruud, C.O., Green, R.E. (eds) Nondestructive Methods for Material Property Determination. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-4769-9_2
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DOI: https://doi.org/10.1007/978-1-4684-4769-9_2
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