Abstract
Silicon Nitride is found to have a valence band maximum of nitrogen lone pair p electrons because of the planar nitrogen site. This contrasts with the usual lone pair semiconductors, such as SiO2, caused by a p4 valence configuration. Consequently although the valence band density of electron states shows a lone pair band and a deeper bonding band as usual, impurities have a greater effect in the nitride than in conventional lone pair semiconductors. Hole transport is also discussed.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
J.J. Chang, Trans.IEEE ED-24, 511 (1977).
P.C. Arnett, Z.A. Weinberg, Trans. IEEE ED-25, 1014 (1978).
Z.A. Weinberg, R.A. Pollak, Appl. Phys. Letts. 27, 254 (1975).
R.W.G. Wyckoff, Crystal Structures, Vol.2, p.159, Wiley, N.Y., (1964).
R. Marchand, Y. Laurent, J. Lang, Act. Cryst. B25, 2157 (1969).
S.T. Pantelides, W.A. Harrison, Phys.Rev. B 13, 2667 (1976).
J. Robertson, J. Phys. C 12, 4753 (1979).
R.B. Laughlin, J.D. Joannopoulos, D.J. Chadi, Phys.Rev. B 20, 5228 (1979).
F.R. McFeely, S.P. Kowalcyzk, L. Ley, R.G. Cavell, R.A. Pollak, D.A. Shirley, Phys. Rev. B 9, 5268 (1974).
H.R. Philipp, J. Electrochem. Soc. JL 20, 296 (1973).
D.J. DiMaria, P.C. Arnett, Appl. Phys. Letts. 26, 711 (1975).
M.V. Coleman, D.J.D. Thomas, Phys.Stat.Solidi. 25, 241 (1968).
J. Stohr, L. Johansson, I. Lindau, P. Pianetta, Phys.Rev. B 20, 644 (1979).
F. Galeener concludes that the nitrogen site in a-Si3N4 is planar from scattering experiments; quoted by G. Lucovsky, J. Non Cryst. Solids 35, 825 (1980).
H.J. Stein, J. Electronic Mats., 5, 161 (1976).
H.J. Stein, S.T. Picraux, P.H. Holloway, Trans. IEEE ED-25, 1008 (1978).
J. Robertson, Phil. Mag., to be published. This paper also discusses the defect model of C.T. Kirk, J. Appl. Phys. 50, 4190 (1979).
R.C. Hughes, Phys. Rev. Letts. 30, 1333 (1973).
N.F. Mott, Adv. Phys. 26, 363 (1977).
M. Kastner, Phys. Rev. Letts. 28, 355 (1972).
N.F. Mott, E.A. Davis, R.A. Sreet, Phil.Mag. 32, 961 (1975).
G. Lucovsky, Phil.Mag. B 39, 531 (1979).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1981 Plenum Press, New York
About this chapter
Cite this chapter
Robertson, J. (1981). The Electronic Structure of Silicon Nitride. In: Devreese, J.T., Lemmens, L.F., Van Doren, V.E., Van Royen, J. (eds) Recent Developments in Condensed Matter Physics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-3899-4_31
Download citation
DOI: https://doi.org/10.1007/978-1-4684-3899-4_31
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-3901-4
Online ISBN: 978-1-4684-3899-4
eBook Packages: Springer Book Archive