Abstract
High frequency acoustic imaging represents a powerful technique for the nondestructive evaluation of optically opaque materials. In this report the Scanning Laser Acoustic Microscope (SLAM) is used to detect and characterize flaws in ceramics. SLAM micrographs showing typical examples of cracks, laminar flaws, porosity and solid inclusions are presented. The various flaw types are easily differentiated on the basis of their characterisitc acoustic signatures. The importance of an imaging approach to the nondestructive evaluation of ceramics is demonstrated.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
D. S. Kupperman, C. Sciammarella, N.P. Lapinski, A. Sather, D. Yuhas, L. Kessler, and N. F. Fiore, “Preliminary Evaluation of Several NDE Techniques for Silicon Nitride Gas-Turbine Rotors”, Argonne National Laboratory Report ANL-77-89, January 1978.
D. E. Yuhas, Characterization of Surface Flaws by Means of Acoustic Microscopy, First International Symposium on Ultrasonic Materials Characterization, June 7–9, 1978, National Bureau of Standards, Gaithersburg, MD., (In Press) ed by: H. Berger (1979.
D. S. Kupperman, L. Pahis, D. Yuhas, and T. McGraw, Acoustic Microscopy for Structural Ceramics, submitted Journal of American Ceramic Society, 1979.
D. E. Yuhas and L. W. Kessler, Scanning Laser Acoustic Microscope Applied to Failure Analysis; Proc. ATFA — 78 IEEE Inc., New York, N. Y. Catalog No. 78CH1407-6 REG6., pp. 25–29 (1978).
Acoustic Microscopy, SEM and Optical Microscopy: Correlative Investigations in Ceramics. Scanning Electron Microscopy 1979, 1, SEM Inc., AMF O’Hare, Il. 60666, pp. 103–110.
D. E. Yuhas, T. E. McGraw, and L. W. Kessler, Scanning Laser Acoustic Microscope Visualization of Solid Inclusions in Silicon Nitride, Proc. ARPA/AFML Conf. on Quantitative NDE., LaJolla., CA. 1979.
Commercially available under trade name S0N0MICR0SC0PE™ 100, Sonoscan, Inc., Bensenville, Illinois 60106.
L. W. Kessler and D. E. Yuhas, Acoustic Microscopy 1979, Proc. IEEE, 67, (4) pp. 526–536 (1979).
S. A. Goss and W. D. O’Brien, Direct Ultrasonic Velocity Measurements of Mammalian Collagen Threads; T. Acoust. Soc. Amer. 65(2) pp. 507–511 (1979)
G. S. Kino, Nondestructive Evaluation, Science, Vol. 206, pp. 173–180, Oct. 1979.
Micrograph Courtesy of J.J. Schuldies, Airesearch Mfg. Co., Phoenix, AR.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1980 Plenum Press, New York
About this chapter
Cite this chapter
Yuhas, D.E., Kessler, L.W. (1980). Defect Characterization by Means of the Scanning Laser Acoustic Microscope (SLAM). In: Wang, K.Y. (eds) Acoustical Imaging. Acoustical Imaging, vol 9. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-3755-3_20
Download citation
DOI: https://doi.org/10.1007/978-1-4684-3755-3_20
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-3757-7
Online ISBN: 978-1-4684-3755-3
eBook Packages: Springer Book Archive