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Real-Time High-Resolution Mass Spectrometry

The Measurement of Accurate Molecular and Fragment Mass, and Relative Ionic Abundance: The Detection and Identification of Unresolved Isobaric Species

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Computers in Analytical Chemistry

Part of the book series: Progress in Analytical Chemistry ((PAC,volume 4))

Abstract

A detailed description of the performance of a computer-coupled, high-resolution mass spectrometer system is presented. The results obtained from this system, which consist of accurate mass and intensity measurements for all ionic species present in a mass spectrum, are presented and discussed in the context of both system evaluation and application to organic analysis. The results indicate that mass measurement accuracies of 1 ppm or better are routinely obtainable through the use of the fouraverage technique, and that intensity measurement accuracy is limited only by ion statistics. Furthermore, system performance remains the same over a wide range of scan rates and mass spectrometer resolutions. Applications of such a system to organic analysis permits rapid acquisition and analysis of spectra and drastically reduces elemental composition ambiguities. A method for resolution of unresolved multiplets based on the mass measurement performance of the system is presented.

Paper XXIII in the series High Resolution Mass Spectrometry in Molecular Structure Studies; for Part XXII, see A. L. Burlingame, D. H. Smith, and R. W. Olsen, Anal. Chem. (in preparation). Support of the National Aeronautics and Space Administration, Grants NGR 05-003-134, NsG 243, Suppl. 5, and NAS 9-7889, is gratefully acknowledged.

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References

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© 1970 Plenum Press, New York

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Burlingame, A.L., Smith, D.H., Merren, T.O., Olsen, R.W. (1970). Real-Time High-Resolution Mass Spectrometry. In: Orr, C.H., Norris, J.A. (eds) Computers in Analytical Chemistry. Progress in Analytical Chemistry, vol 4. Springer, New York, NY. https://doi.org/10.1007/978-1-4684-3315-9_3

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  • DOI: https://doi.org/10.1007/978-1-4684-3315-9_3

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4684-3317-3

  • Online ISBN: 978-1-4684-3315-9

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