Abstract
This concluding chapter is concerned primarily with the future trend toward higher sensitivity in visual systems. Several concepts, already discussed, are reproduced for emphasis and clarity.
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References
M.G. Kovac, W.S. Pike, F.V. Shallcross, and P.K. Weimer, Solid-state imaging emerges from charge transport, Electronics, February 28, 1972.
R. Shaw, The influence of grain sensitivity on photographic image properties, paper presented at the Symposium on Photographic Sensitivity ( Royal Photographic Society ), September 1972, Cambridge.
General
A. Rose, A unified approach to the performance of photographic film, television pickup tubes, and the human eye, J. Soc. Motion Picture Engrs. 47, 273–294 (1946).
Note Added in Proof
For a recent account of progress in compact solid-state sensors, see C.H. Séguin, D. A. Sealer, W. J. Bertram Jr., M. F. Tompsett, R. R. Buckley, T. A. Shankoff, and W. J. McNamara, A charge-coupled area sensor and frame store, IEEE Trans. Electron Devices ED-20, 244–252 (1973).
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© 1973 Plenum Press, New York
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Rose, A. (1973). Vision: Past, Present, and Future. In: Vision. Optical Physics and Engineering. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-2037-1_10
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DOI: https://doi.org/10.1007/978-1-4684-2037-1_10
Publisher Name: Springer, Boston, MA
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