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Crack Formation: Crossovers between Different Growth Regimes and Critical Behavior

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Growth and Form

Part of the book series: NATO ASI Series ((NSSB,volume 276))

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Abstract

It has been customary to describe various growth and aggregation processes by means of power laws, in which the probability of growth of a point at the surface of the pattern is proportional to a power of the value of a given field at that position. These laws are scale invariant, and, when combined with the randomness inherent to the growth process, they give rise to fractal objects, which are also scale invariant1–6. However, we do not expect this to be the most general behavior in nature, and more complex growth laws, with intrinsic length and time scales are likely to occur.

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References

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Author information

Authors and Affiliations

  1. Instituto de Ciencia de Materiales (CSIC). Facultad de Ciencias, Universidad Autónoma, 28049, Madrid, Spain

    O. Pla & F. Guinea

  2. Departamento de Física Aplicada, Universidad de Alicante, Apartado 99, 03080, Alicante, Spain

    E. Louis

  3. Department of Physics, University of Michigan, Ann Arbor, MI, 48109, USA

    L. M. Sander

  4. Central Research and Development Department, E. I. Du Pont de Nemours, Wilmington, DE, 19880-0356, USA

    P. Meakin

Authors
  1. O. Pla
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  2. F. Guinea
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  3. E. Louis
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  4. L. M. Sander
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  5. P. Meakin
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Editor information

Editors and Affiliations

  1. Ecole Normale Supérieure, Paris, France

    M. Ben Amar  & P. Tabeling  & 

  2. Université de Provence-St. Jerome, Marseille, France

    P. Pelcé

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© 1991 Plenum Press, New York

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Pla, O., Guinea, F., Louis, E., Sander, L.M., Meakin, P. (1991). Crack Formation: Crossovers between Different Growth Regimes and Critical Behavior. In: Amar, M.B., Pelcé, P., Tabeling, P. (eds) Growth and Form. NATO ASI Series, vol 276. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-1357-1_32

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  • DOI: https://doi.org/10.1007/978-1-4684-1357-1_32

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-1359-5

  • Online ISBN: 978-1-4684-1357-1

  • eBook Packages: Springer Book Archive

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