Abstract
The essential prerequisite for determination of peak profiles and intensities is calibrated tunneling spectra. The first sections of this chapter will introduce a simple calibration scheme which can be implemented with any type of measurement system assisted by a minicomputer, microcomputer, or sophisticated calculator. The approach will be of a tutorial nature so that the experimenter can obtain the knowledge necessary to interface his own measurement system for use with a computer-controlled data acquisition system. Practical aspects of calibration, shortcuts, and tricks will be discussed in detail along with software-hardware tradeoffs. Following the details of calibration, the subtraction of backgrounds to IET peaks will be discussed in detail along with peak profiles in both the normal and superconducting states, from which peak intensities are easily determined The use of differential inelastic electron tunneling spectra (DIETS) will be briefly mentioned.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
I. Giaever, Energy gap in superconductors measured by electron tunneling, Phys. Rev. Lett. 5, 147–148 (1960).
D. E. Thomas and J. M. Klein, Tunneling current structure resolution by differentiation, Rev. Sci. Instrum. 34, 920–924 (1963).
J. S. Rogers, J. G. Adler, and S. B. Woods, Apparatus for measuring characteristics of superconducting tunnel junctions, Rev. Sci. Instrum. 35, 208–213 (1964).
Ivar Giaever and Karl Megerle, Study of superconductors by electron tunneling, Phvs. Rev. 122, 1101–1111 (1961).
I. Giaever, H. R. Hart, Jr., and K. Megerle, Tunneling into superconductors at temperature below 1 K, Phys. Rev. 126, 941–948 (1962).
William R. Patterson and J. Shewchun, Alternate approach to the resolution of tunneling current structure by differentiation, Rev. Sci. Instrum. 35, 1704–1707 (1964).
D. E. Thomas and J. M. Rowell, Low level second harmonic detection system, Rev. Sci. Instrum. 36, 1301–1305 (1965).
J. G. Adler and J. E. Jackson, System for observing small nonlinearities in tunnel junctions, Rev. Sci. Instrum. 37, 1049–1054 (1966).
A. Gaudefroy-Demonbynes, E. Guyon, A. Martinet, and J. Sanchez, Dérivées premières et secondes de la caractéristique d’une jonction tunnel, Rev. Phys. Appl. 1, 18–22 (1966).
J. Lambe and R. C. Jaklevic, Molecular vibration spectra by inelastic electron tunneling, Phys. Rev. 165, 821–832 (1968).
I I. Andrew Longacre, Jr., Biasing circuitry for tunnel junctions, Rev. Sci. Instrum. 41, 448–449 (1970).
J. S. Rogers, Conductance bridge for electron tunneling measurements, Rev. Sci. Instrum. 41, 1184–1186 (1970).
J. G. Adler, T. T. Chen, and J. Straus, High-resolution electron tunneling spectroscopy, Rev. Sci. Instrum. 42, 362–368 (1971).
B. L. Blackford, Low impedance supply for tunnel junctions, Rev. Sci. Instrum. 42, 1198–1202 (1971).
A. F. Hebard and P. W. Shumate, A new approach to high-resolution measurements of structure in superconducting tunneling currents, Rev. Sci. Instrum. 45, 529–533 (1974).
J. G. Adler and J. Straus, Application of minicomputers in high-resolution electron tunneling, Rev. Sci. Instrum. 46, 158–163 (1975).
S. Colley and P. Hansma, Bridge for differential tunneling spectroscopy, Rev. Sci. Instrum. 48, 1192–1195 (1977).
R. C. Jaklevic and M. R. Gaerttner, Inelastic electron tunneling spectroscopy. Experiments on external doping of tunnel junctions by an infusion technique, Appl. Surf. Sci. 1, 479–502 (1978).
Ursula Mazur and K. W. Hipps, An inelastic electron tunneling spectroscopy study of the adsorption of NCS, OCN, and CN from water solution by Al2O3, J. Phys. Chem. 83, 2773–2777 (1979).
M. V. Moody, J. L. Paterson, and R. L. Ciali, High-resolution dc-voltage-biased ac conductance bridge for tunnel junction measurements, Rev. Sci. Instrum. 50, 903–908 (1979).
L. D. Flesner and A. H. Silver, Improved method of measuring tunneling conductance, Rev. Sci. Instrum. 51, 1411–1412 (1980).
Andrew A. Cederberg, Inelastic electron tunneling spectroscopy: Intensity as a function of surface coverage, Surf Sci. 103, 148–176 (1981).
A. B. Dargis, Digital inelastic electron tunneling spectrometer, Rev. Sci. Instrum. 52, 46–51 (1981).
R. Magno and J. G. Adler, Data calibration in electron tunneling spectroscopy, Rev. Sci. Instrum. 52, 217–223 (1981).
IEEE Standard Digital Interface for Programmable Instrumentation (IEEE Std 488–1975), The Institute of Electrical and Electronic Engineers, Inc., New York (1975).
J. Klein, A. Leger, M. Bell, D. Défourneau, and M. J. L. Sangster, Inelastic electron tunneling spectroscopy of metal-insulator-metal junctions, Phys. Rev. B 7, 2336–2349 (1973).
M. Mikkor and W. C. Vassel, Phonon and plasmon interactions in metal-semiconductor tunneling junctions, Phys. Rev. B 2, 1875–1887 (1970).
R. Magno and J. G. Adler, Intensity and lineshape measurements in inelastic electron tunneling spectroscopy, J. Appl. Phys. 49, 5571–5575 (1978).
J. Kirtley and P. K. Hansma, Vibrational-mode shifts in inelastic electron tunneling spectroscopy: Effects due to superconductivity and surface interactions, Phys. Rev. B 13 2910–2917 (1976).
R. Magno and J. G. Adler, A study of chemisorption of formic acid on different surfaces by electron tunneling, J. AppL Phys. 49, 4465–4467 (1978).
J. G. Adler, M. K. Konkin, and R. Magno, The technology of LETS, in Inelastic Electron Tunneling Spectroscopy ( T. Wolfram, ed.) Springer-Verlag, Berlin (1978).
J. G. Adler, M. K. Konkin, D. P. Mullin, M. A. Ocampo, and J. Urias (to be published).
DC300A Data cartridge.
M. K. Konkin, R. Magno, and J. G. Adler, The use of barrier parameters for the characterization of electron tunneling conductance curves, Solid State Commun. 26, 949–952 (1978).
R. Magno and J. G. Adler, The dependence of metal-insulator-metal conductance curves on chemisorbed ion concentration in the barrier, Surf. Sci. 78, L250 - L256 (1978).
M. K. Konkin and J. G. Adler, Annealing effects in tunnel junctions (thermal annealing), J. Appl. Phys. 50, 8125–8128 (1979).
M. K. Konkin and J. G. Adler, Annealing effects in tunnel junctions (voltage annealing), J. Appl. Phys. 51, 5450–5454 (1980).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1982 Plenum Press, New York
About this chapter
Cite this chapter
Adler, J.G. (1982). Computer-Assisted Determination of Peak Profiles, Intensities, and Positions. In: Hansma, P.K. (eds) Tunneling Spectroscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-1152-2_14
Download citation
DOI: https://doi.org/10.1007/978-1-4684-1152-2_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-1154-6
Online ISBN: 978-1-4684-1152-2
eBook Packages: Springer Book Archive