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Infrared and Raman Studies of Si-Chalcogenide Glasses

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Design of New Materials

Abstract

The atomic structure of Si xX1-x (X=S,Se) glasses is investigated with the combined use of Infrared and high resolution Raman spectroscopy. These measurements permit a careful analysis of the various vibrational modes and the evaluation of structural models for the glasses. Glassy SiX2 alloys are composed of both chains of edge-sharing tetrahedral units and corner-sharing units in which the Si atoms are four-fold coordinated to X atoms and the X atoms are two-fold coordinated to Si atoms. These edge-sharing and corner-sharing tetrahedral units are also present throughout the glass forming range. In the entire composition range studied (0.05<x<0.40) heteropolar bonding is strongly favored. In X-rich glasses (x<l/3), the tetrahedral Si(X1/2)4 units coexists with S(Se) rings and chains. A new molecular unit is present along with the Si tetrahedral units in the Si-rich glasses (x>l/3) and is identified as ethane-like X3-Si-Si-X3 units. The combined use of infrared and Raman spectroscopies provides the strongest evidence to date for the presence of extensive short and medium range order in the Si-chalcogenide glasses.

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© 1987 Plenum Press, New York

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Tenhover, M., Henderson, R.S., Hazle, M.A., Lukco, D., Grasselli, R.K. (1987). Infrared and Raman Studies of Si-Chalcogenide Glasses. In: Cocke, D.L., Clearfield, A. (eds) Design of New Materials. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9501-4_16

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  • DOI: https://doi.org/10.1007/978-1-4615-9501-4_16

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4615-9503-8

  • Online ISBN: 978-1-4615-9501-4

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