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Application of Pattern Recognition to Failure Analysis and Diagnosis

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Human Detection and Diagnosis of System Failures

Part of the book series: NATO Conference Series ((HF,volume 15))

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Abstract

In this chapter, we will be dealing with systems, all initially at the same design, manufacturing, quality control and operating standards. For each set of operating conditions, technical specifications describe the expected performance and characteristics of these systems, all of which cannot, in general, be quantified. After having introduced a number of basic concepts in failure analysis and diagnosis, the relation to pattern recognition will be explained.

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References

  • Barlow, R.E., F. Proschan, “Mathematical theory of reliability” (Wiley, New York 1965).

    Google Scholar 

  • Becker, P.W., “Recognition of patterns using the frequencies of occurrence of binary words”, (Springer Verlag, New York 1978) 3rd ed.

    Google Scholar 

  • Bellman, R., “Dynamic programming, pattern recognition and location of faults in complex systems”, J. of Applied Probability, Vol. 3, 1966, 268–271.

    Article  Google Scholar 

  • Bebzercri, J.P., “L’analyse des données”, Vol. 1 & 2 (Dunod, Paris 1977).

    Google Scholar 

  • Bertails, J.C., J. Zirphile, “Une méthode de conception rapide et fiable des circuits intégrés avec controle automatique de l’implantation”, Revue Technique Thomson-CSF, Vol. 9, No. 4 December 1977, 717–735.

    Google Scholar 

  • Braun, S., “Signal analysis for rotating machinery vibrations”, Pattern Recognition J., Vol. 7, 1975, 81–86.

    Article  Google Scholar 

  • Burrows, A.A., W.L. Miles, “Aircraft fault isolation based on patterns of cockpit indications”, The Aeronautical J., September 1972.

    Google Scholar 

  • Cardillo, G., K.S. Fu, “On suboptimal sequential pattern recognition”, IEEE Trans., Vol. EC-17, No. 8, August 1968, 565–588.

    Google Scholar 

  • Chu, W.W., “Adaptive diagnosis of faulty systems”, Operations Research, Vol. 16, 1968, 915–927.

    Article  Google Scholar 

  • Clark, R.N., D.C. Fobth, W.M. Walton, “Detecting instrument malfunctions in control systems”, IEEE Trans., Vol. AES-11, No. 4, July 1975.

    Google Scholar 

  • Cohn, M., G. Ott, “Design of adaptive procedures for fault detection and isolation”, IEEE Trans., Vol. R-20, No. 1, February 1971, 7–10.

    Google Scholar 

  • Cortina, E., H.L. Engel, W.K. Scott, “Pattern recognition techniques applied to diagnostics”, Soc. Automotive eng., report 700497, 1970.

    Book  Google Scholar 

  • Cortina, E. “Automatic diagnostic equipment studies”, USATACOM TR-11289, 29 January 1971.

    Google Scholar 

  • D’Angelo, H., “Testing networks and the computer-aided design of multi-stage screening processes”, Proc. Southeastcon’ 1978, IEEE, N.Y. 1978, 213–216.

    Google Scholar 

  • De Dombal, F.T., F. Gremy, (ed.), “Decision making and medical care”, (North Holland, Amsterdam 1976).

    Google Scholar 

  • Donio, J., “Problémes de diagnostic par construction d’espaces mesurables”, Metra, Vol. 11, No. 2, 1972, 315–331.

    Google Scholar 

  • Fang, G.S., T. Pavlidis, “Signal classification through quasi— singular detection with application in mechanical fault diagnosis”, IEEE Trans., Vol. IT-18, No. 5, September 1972, 631–636.

    Google Scholar 

  • Frarey, J.L., “Mechanical basis for pattern analysis”, Soc. Automotive eng. report 700496, 1970.

    Book  Google Scholar 

  • Friedland, B. “Maximum-likelihood estimation of a process with random transitions (failures)”, Proc 1978 IEEE Conf. on decision and control, IEEE Catalog 78, CH1392–0CS, 427–432.

    Google Scholar 

  • Fu, K.S., “Sequential methods in pattern recognition and machine learning”, (Adacemic Press, New York 1968).

    Google Scholar 

  • Fu, K.S., “Syntatic methods in pattern recognition” (Academic Press, New York 1974).

    Google Scholar 

  • Fu, K.S., (ed.), “Digital pattern recognition”, Communications and Cybernetics, Vol. 10 (Springer, Berlin 1976).

    Google Scholar 

  • Fukunaga, K., “Introduction to statistical pattern recognition”, (Academic Press, New York, 1972).

    Google Scholar 

  • Gonzalez, R.C., D.N. Fry, R.C. Kryter, “Results in the application of pattern recognition methods to nuclear reactor core component surveillance”, IEEE Trans Nuclear Science, 1974, No. 21, 750–756.

    Google Scholar 

  • Gonzalez, R.C., L.C. Howington, “Machine recognition of abnormal behaviour in nuclear reactors”, IEEE Trans., Vol. SMC-7, No. 10, 1977, 717–728.

    Google Scholar 

  • Goto, N., et al., “An automatic inspection system for mask patterns”, in Proc. 4th Int. J. Conf. pattern recognition (Kyoto), IEEE, N.Y., November 1978.

    Google Scholar 

  • Grellin, G.L., “Special issue on Bayesian reliability techniques”, IEEE Trans. Vol. R-21, No. 3, August 1972.

    Google Scholar 

  • Grenander, U., M. Rosenblatt, “Statistical analysis of stationary time series”, (Wiley, New York, 1957).

    Google Scholar 

  • Gross, A.J., “An approach to the minimization of misclassification in the repair of equipments”, IEEE Trans., Vol. R-19, No. 1, February 1970, 10–13.

    Google Scholar 

  • Gumbel, E.J., “Statistical theory of extremes (Columbia University Press, New York 1958).

    Google Scholar 

  • Gupta, A. et al., “Defect analysis and yield degradation of integrated circuits”, IEEE J. Solid State Circuits, Vol. SC-9, No. 3, 1974, 96–103.

    Article  Google Scholar 

  • Hankley, W.J., H.M. Merrill, “A pattern recognition technique for system error analysis”, IEEE Trans., Vol. R-30, No. 3, August 1971, 148–153.

    Google Scholar 

  • Henriksen, G.M., “Reticles by automatic pattern generation”, in Semiconductor Micrplitography II, SPIE Proc., Vol. 100, 1977, 86–95.

    Google Scholar 

  • Hill, M.O., “Correspondence analysis: a neglected multivariate method”, Applied Statistics, Vol. 23, No. 3, 1974 (Series C), 340–354.

    Article  Google Scholar 

  • Hoffman, R.L., K. Fukunaga, “Pattern recognition signal processing for mechanical diagnostics signature analysis”, IEEE Trans., Vol. C-20, No. 9, September 1969, 1095–1100.

    Google Scholar 

  • Hsiung, C.Y., C.W. Cox, “Pattern classification in scan-type non-destructive tests”, Int. J. Non-destructive testing, Vol. 4, 1972, 231–247.

    Google Scholar 

  • Hughes, R.A., et al., “Using pattern recognition in product assurance”, Proc. Ann. Reliability and Maintainability Symp., Philadelphia, 18–20 January 1977.

    Google Scholar 

  • Joksimovic, V., “Statistical fault analysis method applied to advanced gas cooled reactors”, J. British Nuclear Energy Society. Vol. 9, No. 4, October 1969, 275–302.

    Google Scholar 

  • Jones, J.A., “The analysis of metallurgical data using pattern recognition techniques”, Proc. NAECON, IEEE Catalog 71-C-24-AES-1971.

    Google Scholar 

  • Kittler, J., L.F. Pau, “Small sample properties of a pattern recognition system in lot acceptance sampling”, In Proc. 4th Int. J. Conf. on pattern recognition (Kyoto), (IEEE, New York, 1978).

    Google Scholar 

  • Kulikowski, C.A., “Pattern recognition approach to medical’ diagnosis”, IEEE Trans., Vol. SSC-6, No. 3 July 1970.

    Google Scholar 

  • Larsen, P., “Symbolic layout system speeds mask design for IC’s”, Electronics, Vol. 51, No. 15, 20 July 1978, 125–128.

    Google Scholar 

  • Levadi, V.S., “Automated learning applied to fault diagnosis”, IEEE Trans., Vol. IES-3, No. 6, November 1967, 941–946.

    Google Scholar 

  • Mann, N.R., N.D. Schafer, R. Singpurwalla, “Methods for statistical analysis of reliability and life data”, (Wiley, New York, 1974).

    Google Scholar 

  • Markel, J., A. Gray, “On autocorrelation equations as applied to speech analysis”, IEEE Trans., Vol. AU-21, No. 2, 1973, 69–79.

    Google Scholar 

  • Martin, W.C., W.D. Hokins, “A state space basis for sequential pattern classification”, in Proc. 1st Int. J. Conf. on pattern recognition, IEEE Catalog 73 CHO–821–9c, 1973.

    Google Scholar 

  • Mendel, J., K.S. Fu, (ed.), “Adaptive learning and pattern recognition systems”, (Academic Press, New York 1970).

    Google Scholar 

  • Muehldorf, E.I., “Fault clustering: modelling and observation on experimental LSI chips”, IEEE J. Solid State Circuits, Vol. SC-10, No. 4, 1975, 237–244.

    Article  Google Scholar 

  • Parkhomenko, P.P.O., “Tekhnickeske-diagnostike”, (Znaniye Press Moscow, 1969).

    Google Scholar 

  • Pashkovskiy, G.S., “Optimization of sequential fault detection procedures”, Engineering cybernetics, Vol. 9, No. 2, March 1971, 259–270.

    Google Scholar 

  • Pau, L.F., “Topics in pattern recognition, IMSOR”, (Technical University of Denmark, Lyngby 1973).

    Google Scholar 

  • Pau, L.F., “Applications of pattern recognition to the diagnosis of equipment failures”, Pattern Recognition J., Vol. 6, No. 3, August 1974, 3–11.

    Article  Google Scholar 

  • Pau, L.F., “Diagnosis of equipment failures by pattern recognition”, IEEE Trans. Vol. R-23, No. 3, August 1974, 202–208.

    Google Scholar 

  • Pau, L.F., “Diagnostic Statistique”, Onde Electrique, Vol. 54, No. 10, Decembre 1974, 529–537.

    Google Scholar 

  • Pau, L.F., “Adaptive failure mode diagnosis based on pattern recognition of acoustical spectral measurements”, in Proc. Int. Conf. Monitoring Diagnostics in Industry, (House of Technology, Prague, 1975).

    Google Scholar 

  • Pau, L.F., “Diagnostic statistique: Synthese des informations relatives a la fiabilité et a la maintenance d’un material aéronautique”, L’Aeronautique et l’Astronautique, No. 34, 1972–2, 69–76.

    Google Scholar 

  • Pau, L.F., “Analyse continue des fluctuations d’un parametre de fonctionnement: Application au diagnostic automatique des changements de regime d’une machine”, R.A.I.R.O., Vol. Automatique-11, No. 1, March 1977, 5–15.

    Google Scholar 

  • Pau, L.F., “An adaptive signal classification procedure, application to aircraft engine monitoring”, Pattern Recognition J., Vol. 9, No. 3, October 1977, 121–130.

    Article  Google Scholar 

  • Pau, L.F., et al., “Controle statistique de qualite pour l’instrumentation”, (Statistical quality control by variables: application to instrumentation), (Editions Chiron, Paris 1978).

    Google Scholar 

  • Pau, L.F., “Finite learning sample size problems in pattern recognition”, in C.H. Chen (ed.), Pattern recognition and signal processing, NATO ASI Series E, No. 29, (Sijthoff & Noordhoff, Alphen aan den Rijn The Netherlands, 1978), 83–116.

    Chapter  Google Scholar 

  • Pau, L.F., “Signal Classification by non-parametric sequential tests”, in Proc. AFCET/IRIA Congress on pattern recognition and picture processing, (IRIA, Rocquencourt, 1978; or T.R. ENST-C-78020, ENS Télécommunications, Paris 1978.

    Google Scholar 

  • Pau, L.F., “Failure diagnosis and performance monitoring”, (Marcel Dekker Inc. New York, 1979)

    Google Scholar 

  • Pau, L.F., C.H. Chen, “Multivariate classification rule subject to small learning samples: application to quality control and signal classification”, to appear.

    Google Scholar 

  • Peron, V.I., “Majority gradient method for the optimization of a sequential procedure for checking operatibility, automation and remote control”, February, 1970, No. 2, 282–288.

    Google Scholar 

  • Persoon, E., “Dynamic sequential pattern recognition applied to medical diagnosis”, (T.R. Purdue University, AD-734292, July 1971).

    Google Scholar 

  • Piety, K.R., J.C. Robinson, “An on-line reactor surveillance algorithm based on multivariate analysis of noise”, Nucl. Sci. Eng., Vol. 59, No. 4, 1976, 369–380.

    Google Scholar 

  • Pokrowsky, F.N., “On reliability prediction by pattern classification”, Proc. Ann. Reliability and maintainability Symp., IEEE Catalog 72-CH-0577–7R, 367–375.

    Google Scholar 

  • Rabiner, L.R., B. Gold, “Theory and application of digital signal processing”, (Prentice Hall, Englewood Cliffs 1975).

    Google Scholar 

  • Saeks, R., S. R. Liberty, “Rational fault analysis”, (Marcel Dekker Inc., New York, 1977).

    Google Scholar 

  • Saridis, G.N., R.F. Hofstadter, “A pattern recognition approach to the classification of non-linear systems”, IEEE Trans., Vol. SMC-4, No. 4, July 1974, 362–371.

    Google Scholar 

  • Skinner, J.G., “The use of an automatic mask inspection system in photomask fabrication”, in: Semiconductor Microlitography SPIE Proc. Vol. 100, 1977, 20–36.

    Chapter  Google Scholar 

  • Slagle, J.R., R.C.T. Lee, “Application of game tree searching techniques to sequential pattern recognition”, Comm. of the ACM, Vol. 14, No. 2, 1971, 103–110.

    Article  Google Scholar 

  • Solomon, H., “A first application of clustering techniques to fleet material condition measurements”, T.R. T-238, (George Washington University, Washington, D.C. June 1970).

    Google Scholar 

  • Spire, O., “Determination de l’importance relative de differents parameters descriptifs pour l’obtention d’un diagnostic”, R.A.I.R.O., Vol. 4, No. 1, 1970, 85–99.

    Google Scholar 

  • Sterling, W.M., “Automatic non-reference optical inspection of printed wiring boards”, Proc. OSA/IEEE Conf. on laser and electrooptical systems, San Diego, 7–8 February, 1978, IEEE (New York 1978), 66.

    Google Scholar 

  • Thatte, S.M., “Fault diagnosis of semi-conductor random access memories”, AD-A-044281, 1977.

    Google Scholar 

  • Thomas, D.W., B.R. Wilkins, “The analysis of vehicle sounds for recognition”, Pattern Recognition J., Vol. 4, 1972, 379–389.

    Article  Google Scholar 

  • Tsokos, C.P., I.N. Shimi, “The theory and applications of reliability with emphasis on B’ayesian and non-parametric methods”, Vol. 1 & 2 (Academic Press, New York 1977).

    Google Scholar 

  • Vancleemput, V.M., “Topological circuit layout”, AD-A-048050, 1976.

    Google Scholar 

  • Van de Wiele (ed.), “NATO ASI on process and device modelling for integrated circuit design”, (Noordhoff, Groningen, The Netherlands, 1977).

    Google Scholar 

  • Waidelich, J., “Methoden der Mustererkennung zur Fehlerdiagnose von Digital rechnern”, T.R. KFK-PDV-127, Kernforschungszentrum Karlsruhe, Karlsruhe, November 1977.

    Google Scholar 

  • Wald, A., J. Wolfowitz, “Optimum character of sequential probability ratio test”, Ann. Math. Stat., Vol. 19, 1948, 326–329.

    Article  Google Scholar 

  • Watanabe, Y. et al., “A fundamental experiment on automatic LSI mask pattern drawing reading”, in Proc. 4th Int. J. Conf. pattern recognition (Kyoto), IEEE, N.Y. November 1978.

    Google Scholar 

  • Yermachenko, A.I., V.V. Sdor, “Automatic classification and pattern recognition diagnostics and realiability”, Soviet Automatic Control, Vol. 8, No. 4, July 1975, 1–5.

    Google Scholar 

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© 1981 Plenum Press, New York

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Pau, L.F. (1981). Application of Pattern Recognition to Failure Analysis and Diagnosis. In: Rasmussen, J., Rouse, W.B. (eds) Human Detection and Diagnosis of System Failures. NATO Conference Series, vol 15. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9230-3_25

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  • DOI: https://doi.org/10.1007/978-1-4615-9230-3_25

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4615-9232-7

  • Online ISBN: 978-1-4615-9230-3

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