Abstract
In this final chapter, we discuss how the instrumentation, theory and techniques described earlier are used to obtain practical information from electron-microscope specimens. The general sequence will be: low-loss spectroscopy, core-loss spectroscopy, energy-filtered imaging, and analysis of fine structure in the energy-loss spectrum.
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© 1986 Plenum Press, New York
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Egerton, R.F. (1986). Applications of Energy-Loss Spectroscopy. In: Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6887-2_5
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DOI: https://doi.org/10.1007/978-1-4615-6887-2_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-6889-6
Online ISBN: 978-1-4615-6887-2
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