Abstract
To characterize a specimen completely in terms of its inelastic scattering, it would be necessary to record the scattered intensity J(x, y, θ x , θ y , E) as a function of position (specified by coordinates x and y) on the specimen, as a function of the coordinates of angular deflection θ x and θ y , and as a function of energy loss E. Even if such a procedure were technically feasible, it would involve storing a very large amount of data, so in practice an energy-loss experiment records one of the following:
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(a)
The intensity J(x, y) or J(θ x , θ y ), for a given value of E or a specified range of energy loss. These data correspond to an energy-filtered image or diffraction pattern, and can be obtained using either scanning-beam (STEM) or fixed-beam (CTEM) techniques, as discussed in Section 2.4.
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(b)
The intensity J(E) at a given point on the specimen or, more precisely, ∫ J(E) dx dy, where the limits of integration are defined by x2 + y2 = d2/4, d being the diameter of the incident beam. Here were are referring to energy-loss spectroscopy (or energy analysis) carried out using a double-focusing spectrometer such as the magnetic prism (Sections 2.1.1 and 2.2).
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(c)
The intensity J(y, E) for a fixed value of the spatial coordinate x, or J(θ y , E) for a given θ x . This involves energy analysis along a line drawn through the specimen or its diffraction pattern and requires a spectrometer which focuses only in the direction of dispersion, such as the Möllenstedt analyzer (Section 2.1.4) or the Wien filter (Section 2.1.3).
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© 1986 Plenum Press, New York
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Egerton, R.F. (1986). Instrumentation for Energy-Loss Spectroscopy. In: Electron Energy-Loss Spectroscopy in the Electron Microscope. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6887-2_2
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DOI: https://doi.org/10.1007/978-1-4615-6887-2_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-6889-6
Online ISBN: 978-1-4615-6887-2
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