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An Introduction to Electron Energy-Loss Spectroscopy

  • Ray F. Egerton
Chapter

Abstract

In the transmission electron microscope, electrons are accelerated to an energy which is high enough (10 keV to 10 MeV) to ensure that they are transmitted through a thin specimen rather than being brought to rest and absorbed. We begin this introduction with a simplified account of the physical processes which occur while these “fast” electrons are passing through the specimen.

Keywords

Inelastic Scattering Scanning Transmission Electron Microscope Rutherford Backscattering Spectroscopy Thin Specimen Ultraviolet Photoelectron Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Further Reading

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Copyright information

© Plenum Press, New York 1986

Authors and Affiliations

  • Ray F. Egerton
    • 1
  1. 1.University of AlbertaEdmontonCanada

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