Abstract
The previous chapters have outlined the industrial scheduling problems for which we wish to develop scheduling algorithms, the advantages of decomposition algorithms for these problems and a review of decomposition methods that have been developed for various scheduling problems in the past. In particular, Chapter 5 discussed workcenter-based decomposition algorithms for the job shop environment without sequence-dependent setup times. These approaches are generic in that they do not exploit special structure in the routings or other aspects of the problem.
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© 1997 Springer Science+Business Media New York
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Ovacik, I.M., Uzsoy, R. (1997). A Generic Decomposition Procedure for Semiconductor Testing Facilities. In: Decomposition Methods for Complex Factory Scheduling Problems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6329-7_6
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DOI: https://doi.org/10.1007/978-1-4615-6329-7_6
Publisher Name: Springer, Boston, MA
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