Abstract
In the previous chapter we have examined the performance of several tailored decomposition procedures for semiconductor testing problems. These results indicate that the integration of tailored control structures with effective, optimization-based procedures for solving the subproblems can yield substantial improvements in solution quality over myopic dispatching rules or generic decomposition procedures in computation times that are reasonable for the environments being considered.
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References
Holtsclaw, H.H., Uzsoy, R., “Machine Criticality Measures and Subproblem Solution Procedures in Shifting Bottleneck Methods: A Computational Study”, Journal of the Operational Research Society 47, 666–677 (1996).
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© 1997 Springer Science+Business Media New York
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Ovacik, I.M., Uzsoy, R. (1997). The Effects of Subproblem Solution Procedures and Control Structures. In: Decomposition Methods for Complex Factory Scheduling Problems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6329-7_12
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DOI: https://doi.org/10.1007/978-1-4615-6329-7_12
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-7906-5
Online ISBN: 978-1-4615-6329-7
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