Abstract
Chip test practices such as functional test and Bist, and their relevance to MCM testing are summarized. Drawbacks of using these techniques, for some MCMs, are presented. Board test practices such as in-circuit test and boundary-scan, are summarized; the advantages of incorporating board test techniques for certain MCMs are given. Test strategies are categorized and compared. Appropriate MCM test equipment is discussed. Examples of using chip, board, and hybrid test approaches are then given.
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© 1997 Springer Science+Business Media New York
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Flint, A., Zorian, Y. (1997). MCM Test Strategy Synthesis from Chip Test and Board Test Approaches. In: Zorian, Y. (eds) Multi-Chip Module Test Strategies. Frontiers in Electronic Testing, vol 7. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6107-1_6
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DOI: https://doi.org/10.1007/978-1-4615-6107-1_6
Publisher Name: Springer, Boston, MA
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