Abstract
This chapter and Chapter 5 include a reprise of the discussion in the earlier chapters pertinent to these sections, and together with Chapter 5 present guidelines for use in practical applications. Besides understanding the basic tenets of the discipline of single event phenomena (SEP), it is felt important for the reader that they be transformed into useful expressions so as to obtain practical answers to important questions. Examples include the following:
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a
how to compute SEU error rates for various radiation particle environments to satisfy electronic designer needs
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b
how to accomplish part selection with an eye to choosing those that are sufficiently SEU radiation “hard” for the particular electronics system application, within the constraints of ever fewer hardened part lines from vendors since the end of the cold war
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c
maintaining a knowledge of part-function hierarchy with respect to SEU phenomena consequences within the context of the system being built
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d
staying aware of the implication of test results as correlated with the needs of the system program
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e
understand SEP in terms of appropriate weight given to it as compared with other system engineering and radiation requirements
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Messenger, G.C., Ash, M.S. (1997). Single Event Upset Practice. In: Single Event Phenomena. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6043-2_8
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