Abstract
This chapter continues the discussion of the other important facets of single event phenomena. It begins with multiple event effects where one incident single event upset (SEU)-inducing ion can produce more than one bit upset in the same memory array, for example. Following the above is a discussion of the effects of a device exposed to an ionizing dose of radiation prior to and/or during the occurrence of an SEU. The ionizing dose is usually construed, but not exclusively, as that from gamma rays, X-rays, protons, or electrons, corresponding to the particular hostile or benign environment in which the device finds itself.
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Messenger, G.C., Ash, M.S. (1997). Single Event Phenomena II. In: Single Event Phenomena. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6043-2_7
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DOI: https://doi.org/10.1007/978-1-4615-6043-2_7
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