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Single Event Upset Error Rates

  • Chapter
Single Event Phenomena

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Abstract

This chapter together with Chapter 8 provides the major share of the discussion on the practical aspects of single event upset (SEU). This includes formulas for computing SEU in various particle environments. Section 5.2 discusses SEU calculations for heavy-ion cosmic rays at geosynchronous altitudes and Section 5.3 for Van Allen belt protons. Section 5.4 is on SEU-inducing neutrons at cruising altitudes for high-flying aircraft, and Section 5.5 is on alpha particles in microcircuit chip packages. Finally, Section 5.6 discusses ground-level SEU. The formulas are derived from the fundamentals given in the earlier chapters, and their limitations with regard to applicability are delineated. Also, their evolution as it pertains to an increase in understanding single event phenomena up to present-day concepts are discussed.

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Author information

Authors and Affiliations

  1. Las Vegas, Nevada

    George C. Messenger (Nuclear Radiation Effects Consultant, Messenger and Associate)

  2. Santa Monica, California

    Milton S. Ash (Radiation Effects Consultant)

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  1. George C. Messenger
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© 1997 Springer Science+Business Media Dordrecht

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Messenger, G.C., Ash, M.S. (1997). Single Event Upset Error Rates. In: Single Event Phenomena. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6043-2_5

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  • DOI: https://doi.org/10.1007/978-1-4615-6043-2_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-412-09731-7

  • Online ISBN: 978-1-4615-6043-2

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