Abstract
The discussion in this chapter centers around the major single event upset (SEU) simulation sources. Their importance lies in the fact that simulation methods are one of the few means by which microcircuit susceptibility to SEU can be measured. These sources and source types are few in number, principally because of the somewhat unusual properties of the corresponding particles required for substantive simulation. They must be heavy, as in the medium and high mass number end of the periodic table, ionized, and highly energetic to reasonably simulate cosmic rays incident on spacecraft avionics. For these reasons, the simulation sources are primarily particle accelerators such as synchrotrons.
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Messenger, G.C., Ash, M.S. (1997). Single Event Upset: Experimental. In: Single Event Phenomena. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6043-2_4
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DOI: https://doi.org/10.1007/978-1-4615-6043-2_4
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