Abstract
The implementation of test improvements can have a significant impact on product lifecycle costs. However, the time lag in accruing potential benefits can be problematic when attempting to justify the required investment. This can be overcome if a phased implementation is adopted where each interim level of investment delivers less substantial but more immediate gains. This chapter demonstrates that techniques previously used to investigate cost-saving opportunities at strategic and lifecycle level can be used within a system manufacturing process to achieve tangible short-term benefits. The failure profile of a system level test process is characterized and used to drive defect elimination and optimum test times. Various “stopping criteria”, product-process comparisons and improvements are discussed.
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© 1998 Springer Science+Business Media New York
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Farren, D., Chan, W., Ambler, A.P. (1998). System Level Test Process Characterization and Improvement. In: Research Perspectives and Case Studies in System Test and Diagnosis. Frontiers in Electronic Testing, vol 13. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5545-2_7
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DOI: https://doi.org/10.1007/978-1-4615-5545-2_7
Publisher Name: Springer, Boston, MA
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