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Testing Induced Nanoscale Instabilities of Secondary Phases in Si3N4, the Tem Approach to High-Temperature Microstructures

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Ceramic Microstructures

Abstract

The significance of dynamic microstructures in liquid-phase sintered Si3N4 due to the constraints of HT-testing is addressed by focusing on three Si3N4 materials which have been tested on a different time scale extending from several minutes to well in excess of 1000 hours. As shown by high-resolution and analytical transmission electron microscopy, HT-testing can introduce nanoscale morphological and compositional instabilities of both the amorphous and crystalline secondary phases, providing a surprisingly sensitive tool to monitor the response of Si3N4 materials at high temperatures, which is otherwise insufficiently described by the as-sintered microstructure.

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Author information

Authors and Affiliations

  1. German Aerospace Research Establishment (DLR), Materials Research Institute, D-51147, Cologne, Germany

    W. Braue

  2. University of Bayreuth, Materials Research Institute (IMAI), D-95440, Bayreuth, Germany

    H.-J. Kleebe

Authors
  1. W. Braue
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  2. H.-J. Kleebe
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Editor information

Editors and Affiliations

  1. Lawrence Berkeley National Laboratory, Berkeley, California, USA

    Antoni P. Tomsia

  2. University of California, Berkeley, Berkeley, California, USA

    Andreas M. Glaeser

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Braue, W., Kleebe, HJ. (1998). Testing Induced Nanoscale Instabilities of Secondary Phases in Si3N4, the Tem Approach to High-Temperature Microstructures. In: Tomsia, A.P., Glaeser, A.M. (eds) Ceramic Microstructures. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5393-9_9

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  • DOI: https://doi.org/10.1007/978-1-4615-5393-9_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-7462-6

  • Online ISBN: 978-1-4615-5393-9

  • eBook Packages: Springer Book Archive

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