Abstract
In a radiograph the value of each pixel is related to the material thickness crossed by the X-Rays. Using this relationship, a defect in an object can be located and furthermore characterized by parameters such as depth, surface and volume.
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© 1998 Plenum Press, New York
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Retraint, F., Dinten, J.M., Campagnolo, R., Peyrin, F. (1998). Quantitative X-Ray Inspection. In: Thompson, D.O., Chimenti, D.E. (eds) Review of Progress in Quantitative Nondestructive Evaluation. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5339-7_46
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DOI: https://doi.org/10.1007/978-1-4615-5339-7_46
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