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Characterization of Piezoelectrics Using Line-Focus Transducer

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Review of Progress in Quantitative Nondestructive Evaluation

Abstract

Besides providing comparable resolution as light microscope, acoustic microscope (AM) has its unique application in the area material characterization. Material characterization using AM is based on the measurement of leaky surface wave speed, which is extracted from the so-called V(z) curve[1]. In this V(z) technique, usually a tonebust mode of operation is required and relatively higher equipment cost is needed.

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References

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Author information

Authors and Affiliations

  1. Department of Mechanical Engineering, Chang Gung University, 259 Wen-Hua 1st Rd., Kwei-Shan, Taoyuan, Taiwan

    Che-Hua Yang

Authors
  1. Che-Hua Yang
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Editor information

Editors and Affiliations

  1. Center for NDE Ames Laboratory (USDOE) and Department of Aerospace Engineering and Engineering Mechanics, Iowa State University, Ames, Iowa, USA

    Donald O. Thompson

  2. Center for NDE and Department of Aerospace Engineering and Engineering Mechanics, Iowa State University, Ames, Iowa, USA

    Dale E. Chimenti

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© 1998 Plenum Press, New York

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Yang, CH. (1998). Characterization of Piezoelectrics Using Line-Focus Transducer. In: Thompson, D.O., Chimenti, D.E. (eds) Review of Progress in Quantitative Nondestructive Evaluation. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5339-7_22

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  • DOI: https://doi.org/10.1007/978-1-4615-5339-7_22

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-7436-7

  • Online ISBN: 978-1-4615-5339-7

  • eBook Packages: Springer Book Archive

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