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Silicon (Si)

  • Chapter
Optical Constants of Crystalline and Amorphous Semiconductors

Abstract

Silicon (Si) is the second most common element in the upper layer of the earth’s crust (about 25% of the crust consists of Si, and only oxygen exceeds it in abundance); however, this element is usually not found free, but mainly in its oxides and silicates. The Czochralski method is commonly used to produce single crystals of Si used for solid-state devices. Crystalline Si has a metallic luster and grayish color, and transmits more than 95% of all wavelengths of infrared, from 1.3 to 6.7 µm. Because of the pre-eminent position in VLSI circuit applications, Si-based devices now constitute about 95% of all semiconductor devices sold worldwide [1,2]. Even though some III–V compounds (such as GaAs and InGaAs) have certain advantages in material properties over Si, this trend is unlikely to change during the next few decades.

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Authors and Affiliations

  1. Department of Electronic Engineering, Gunma University, Kiryu-shi, Gunma, 376-8515, Japan

    Sadao Adachi

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© 1999 Springer Science+Business Media New York

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Adachi, S. (1999). Silicon (Si). In: Optical Constants of Crystalline and Amorphous Semiconductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5247-5_3

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  • DOI: https://doi.org/10.1007/978-1-4615-5247-5_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-7923-8567-7

  • Online ISBN: 978-1-4615-5247-5

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